Light-Scattering Particle Identifiers for Anti-Forgery Authentication
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Solution Overview
Problem
Existing identifiers such as barcodes and QR codes are easily forgeable and lack individuality, leading to misrepresentation of product origin and quality in supply chains.
Innovation Solution
Utilizing patterns with randomly positioned light-scattering particles to create unique identifiers by capturing and comparing light reflection patterns, ensuring each pattern is distinct and difficult to replicate.
Engineering Contradictions & Design Principles
Engineering Contradiction Analysis
1Reliability
If traditional machine-readable symbols (barcodes, QR codes) are used as identifiers, then the identification process is simple and efficient, but the identifiers are easily forged and lack individuality
Solution Approach 1:
The patent changes the fundamental parameter of identifier structure from flat 2D patterns to 3D patterns with light-scattering particles embedded at varying depths. This creates unique light reflection patterns that are difficult to replicate, thereby improving authentication security while maintaining practical usability through optical scanning
Solution Approach 2:
The identifier combines multiple materials with different optical properties: a base pattern material (ink, paint, or dendritic structure) with embedded light-scattering particles (metal flakes, glass beads, or other reflective particles). This composite structure creates complex light interaction patterns that enhance security while remaining manufacturable
2Reliability
If random light-scattering particles are embedded in patterns, then unique authentication is achieved, but the manufacturing process becomes more complex
Solution Approach 1:
The light-scattering particles are embedded in the pattern material during the manufacturing process itself, before the final product is created. This preliminary action ensures unique particle distributions are locked in place, providing inherent uniqueness without requiring post-manufacturing manipulation
Solution Approach 2:
The random distribution of light-scattering particles naturally creates unique patterns without requiring deliberate programming or precise positioning. The system leverages the inherent randomness of particle embedding to generate unique identifiers automatically, reducing manufacturing complexity
3Measurement precision
If multiple illumination angles are used to capture light reflection patterns, then authentication accuracy is improved, but the measurement process becomes more time-consuming
Solution Approach 1:
The system uses periodic or sequential illumination from multiple angles to capture light reflection patterns. By illuminating the pattern at different angles in sequence and capturing the reflected light patterns, the system achieves comprehensive authentication data collection while maintaining efficient processing through structured measurement sequences
Applied Scientific Principles
This section explains which scientific principles are used to turn an abstract innovation direction into a practical engineering solution.
Function Achieved in This Case
Provides secure and unique authentication of items by leveraging the random positioning of light-scattering particles, making it challenging to duplicate the light reflection patterns, thereby ensuring authenticity.
Implementation Method 1
patterns with light scattering particles to authenticate and uniquify the patterns
Implementation Method 2
obtaining, with the first imaging device, a first test image of light reflected by the first multiplicity of particles
Data Source
AI summary
Identifying a test pattern includes positioning a test pattern that includes a first multiplicity of particles that reflect or emit light in the field of view of a first imaging device; illuminating the test pattern with light from a first light source; obtaining, with the first imaging device, a first test image of light reflected by the first multiplicity of particles; and comparing the first test image with a first reference image of a reference pattern obtained by a second imaging device.