Light Sensor With Embedded Opaque Slats for Direction Detection
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Solution Overview
Problem
Conventional semiconductor light sensors require external components like collimators or polarizers to measure both the intensity and direction of ambient light, which complicates their design and reduces their efficiency in controlling display devices effectively.
Innovation Solution
A semiconductor light sensor with a dielectric layer and embedded opaque slats that determine the direction of incident light by creating asymmetrical apertures, allowing for the detection of both inclination and azimuth angles without external directional components, integrated with photo detectors and a signal processor to compute light intensity and direction.
Engineering Contradictions & Design Principles
Engineering Contradiction Analysis
1Measurement precision
If external components such as collimators or polarizers are used to measure both intensity and direction of ambient light, then measurement precision is improved, but device complexity increases
Solution Approach 1:
The patent combines multiple functions (intensity detection, azimuth angle detection, inclination angle detection) into a single integrated sensor package. The collimator array with multiple photodetectors and the polarization filter array with additional photodetectors are integrated on a single substrate, eliminating the need for separate external components and reducing overall device complexity while maintaining measurement precision.
Solution Approach 2:
The sensor design achieves multi-functionality by using a single integrated structure that can simultaneously measure light intensity, determine azimuth angle through collimator arrays, and detect inclination angle through polarization filters. This universal sensor replaces multiple separate devices, reducing system complexity while providing comprehensive light field measurement capabilities.
2Productivity
If multiple photodetectors and optical components are integrated in a single package, then productivity is improved, but manufacturing precision requirements increase
Solution Approach 1:
The sensor is divided into distinct functional segments: collimator arrays for azimuth detection, polarization filter arrays for inclination detection, and multiple photodetector regions. Each segment can be manufactured and aligned independently using standard semiconductor fabrication techniques, making the overall manufacturing process more manageable while achieving high integration density.
Solution Approach 2:
The design employs a nested structure where multiple layers of optical components (collimators, polarization filters) and photodetectors are stacked vertically in a compact arrangement. This three-dimensional nesting maximizes the use of available space, allowing multiple functional elements to be integrated in a single package without requiring excessive lateral area, thereby improving productivity while managing manufacturing complexity.
Applied Scientific Principles
This section explains which scientific principles are used to turn an abstract innovation direction into a practical engineering solution.
Function Achieved in This Case
Enables efficient detection of light intensity and direction within a single package, reducing the need for external components and enhancing image quality by controlling display devices' brightness and orientation based on ambient illumination.
Implementation Method 1
The dielectric layer is substantially transparent to the incident light
Implementation Method 2
The stacks of opaque slats are embedded within the dielectric layer... The stacks of opaque slats define light apertures between adjacent stacks of opaque slats
Implementation Method 3
The photo detectors detect the incident light through the dielectric layer
Data Source
AI summary
A light sensor and light sensing system to detect an intensity of incident light and an angle of incidence of the incident light. The light sensor includes a dielectric layer, a plurality of photo detectors coupled relative to the dielectric layer, and a plurality of stacks of opaque slats embedded within the dielectric layer. The dielectric layer is substantially transparent to the incident light. The photo detectors detect the incident light through the dielectric layer. The stacks of opaque slats are approximately parallel to an interface between the dielectric layer and the photo detectors. The stacks of opaque slats define light apertures between adjacent stacks of opaque slats. At least some of the stacks of opaque slats are arranged at a non-zero angle relative to other stacks of the opaque slats.