Light Sheet Microscope with Independent Manipulation Optics
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Solution Overview
Problem
Existing light sheet microscopes lack the capability for precise, sample-saving optical manipulation, particularly in axially limited areas, which is essential for deeper examination of samples without complete penetration by manipulation light.
Innovation Solution
The development of a light sheet microscope that uses independent means to load samples with light intensity in essentially point-shaped areas, both laterally and axially, within the light sheet or a given volume, utilizing a separate manipulation lens and spatial light modulators to achieve precise manipulation.
Engineering Contradictions & Design Principles
Engineering Contradiction Analysis
1Adaptability or versatility
If a light sheet microscope is used for observation, then sample areas can be captured in wide field with greater penetration depth, but the microscope lacks capability for precise optical manipulation in axially limited areas
Solution Approach 1:
The patent segments the illumination function by introducing a separate manipulation optics system independent from the light sheet generation. This allows the light sheet to remain dedicated to observation while a separate optical path handles manipulation, enabling precise axial control through independent focusing mechanisms.
Solution Approach 2:
The patent introduces an intermediary manipulation optics system that acts as a mediator between the light sheet microscope and the sample. This separate optical path with its own objective lens and focusing mechanisms enables precise manipulation without interfering with the light sheet observation function.
2Measurement precision
If manipulation light penetrates the sample completely for examination, then deeper areas can be examined, but this causes sample damage and interference
Solution Approach 1:
The patent applies local quality by enabling manipulation light to be focused precisely at specific axial positions within the sample rather than penetrating completely through. The independent focusing mechanism allows high-intensity manipulation light to be confined to localized regions, examining deep areas without exposing the entire sample path to damaging intensities.
Solution Approach 2:
The patent uses partial action by allowing manipulation light to penetrate only to the required depth rather than completely through the sample. The independent focusing system enables selective illumination of specific axial regions, providing sufficient penetration for deep examination while avoiding excessive exposure that would cause sample damage.
3Device complexity
If the same optics are used for both light sheet generation and manipulation, then device complexity is reduced, but precise independent manipulation cannot be achieved
Solution Approach 1:
The patent segments the optical system into distinct functional modules: light sheet generation optics and separate manipulation optics. This segmentation provides independent control mechanisms for each function, allowing precise manipulation without compromising light sheet quality, while the modular design manages complexity through functional separation.
Applied Scientific Principles
This section explains which scientific principles are used to turn an abstract innovation direction into a practical engineering solution.
Function Achieved in This Case
This approach enables sample-saving manipulation by restricting light intensity deposition to small, defined areas, allowing for independent observation and manipulation, thereby reducing sample interference and enhancing the depth of analysis.
Implementation Method 1
a first spatial light modulator (23) for imposing a predetermined intensity distribution on the sample
Implementation Method 2
for exposing the sample to light intensity in essentially point-shaped areas in the light sheet plane or in a predetermined volume
Data Source
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Figure 5
AI summary
The invention relates to a single plane illumination microscope comprising an illumination optical system for illuminating a sample (1) located on a sample carrier (2) in a medium, the sample carrier (2) extending parallel to a planar reference surface (3). The sample is illuminated by a light sheet via an illumination light path. The single plane illumination microscope also comprises a detection optical system having a detection beam path. The optical axes of the illumination optical system and the detection optical system each define an angle that is not equal to zero degrees along with the normal to the reference surface (3). The single plane illumination microscope further comprises a barrier layer system which includes at least one layer of a given material having a given thickness and which separates the medium from the illumination and detection optical systems, a base area of the barrier layer system being in contact with the region that is accessible for illumination and detection activities, said base area running parallel to the reference surface (3). At least one corrective element in the illumination beam path and/or the detection beam path allows those aberrations to be reduced which are created when light to be detected or light for illuminating the sample (1) penetrates interfaces of the barrier layer system at an angle. A single plane illumination microscope of this type comprises means, which are independent of the generation of the light sheet, for applying, via at least one manipulation beam path, light intensity to the sample (1) in substantially point-shaped regions of the light sheet plane or in a given volume that at least temporarily encompasses the light sheet plane.