Light Source Measurement Apparatus for LD Bar Characterization
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Solution Overview
Problem
Existing light source measurement technologies face challenges in accurately measuring beam characteristics and positional deviations of light emission points in high-power direct diode lasers with multiple emission points, particularly in LD bars, due to difficulties in distinguishing and isolating individual emission points and maintaining accurate beam polarization.
Innovation Solution
A light source measurement apparatus employing an objective lens, orthogonal reflection attenuation filters, and a space filter with a slit design that differentiates between fast and slow directions of light emission points, allowing for precise measurement of near and far field patterns and positional deviations of individual emission points.
Engineering Contradictions & Design Principles
Engineering Contradiction Analysis
1Illumination intensity
If a single filter is used to attenuate light from high-power light sources, then light intensity is reduced, but beam polarization characteristics are altered
Solution Approach 1:
The patent divides the single filter function into two separate reflection attenuation filters with orthogonal polarization directions. Each filter handles one polarization component, allowing light intensity reduction while preserving the original polarization characteristics of the beam.
Solution Approach 2:
The patent changes the polarization state parameter by using filters oriented at different polarization angles (orthogonal to each other). This allows selective attenuation of different polarization components while maintaining the overall polarization integrity of the measured beam.
2Device complexity
If conventional measurement methods are used for multi-point light sources, then measurement setup is simple, but individual emission points cannot be distinguished
Solution Approach 1:
The patent applies spatial filtering to segment and isolate individual light emission points from the multi-point light source. The space filter with its specific aperture design allows only light from targeted emission points to pass through, enabling precise measurement of each point's beam characteristics separately.
Solution Approach 2:
The patent introduces a space filter as an intermediary element between the light source and detector. This filter acts as a spatial selector that mediates which emission points are measured, allowing precise control over which individual points contribute to the measurement signal.
3Device complexity
If space filter is not used, then optical path is simple, but light from multiple emission points cannot be isolated
Solution Approach 1:
The patent extracts and isolates light from individual emission points using a space filter. By positioning the filter at a specific location in the optical path where light from different emission points is spatially separated, it extracts only the desired emission point light while blocking others.
Applied Scientific Principles
This section explains which scientific principles are used to turn an abstract innovation direction into a practical engineering solution.
Function Achieved in This Case
Enables accurate optical design and precise measurement of each light emission point in LD bars, improving the accuracy of beam characterization and reducing heat damage risks, while maintaining beam polarization integrity.
Implementation Method 1
an objective lens that collects light emitted from a light source
Implementation Method 2
a first reflection attenuation filter that causes a part of light emitted from the objective lens to pass the first reflection attenuation filter
Implementation Method 3
the first reflection attenuation filter and the second reflection attenuation filter are disposed such that polarization directions of the first reflection attenuation filter and the second reflection attenuation filter are orthogonal to each other
Implementation Method 4
a condensing lens to which light having passed through the second reflection attenuation filter is incident
Implementation Method 5
a space filter that is disposed at a condensing position of light collected by the condensing lens, in which the space filter has a slit that is longer in a direction matching the fast direction of a measurement target light emission point
Data Source
AI summary
A light source measurement apparatus includes an objective lens that collects light emitted from a light source having a plurality of light emission points, a first reflection attenuation filter, a second reflection attenuation filter, a condensing lens, a space filter, and a movable stage, in which the first reflection attenuation filter and the second reflection attenuation filter are disposed such that polarization directions are orthogonal to each other, in which the space filter has an opening through which light emitted from a measurement target light emission point among the plurality of light emission points is transmitted, and in which the opening has a shape in which a dimension of the measurement target light emission point in a fast direction is larger than a dimension of the measurement target light emission point in a slow direction.