Light-Emitting Substrate Test Layout for Micro LED Power Detection
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Solution Overview
Problem
The manufacturing of Micro LED display devices is hindered by the complexity of the mass transfer process, and the detection of current and voltage information in light-emitting substrates is challenging due to the large number of devices and complex circuit arrangements, making it difficult to ensure proper power supply and light emission.
Innovation Solution
A light-emitting substrate design with a test region and bonding region on opposite sides of the light-emitting region, featuring specific pad and test device configurations, and simplified signal line arrangements to facilitate efficient detection and connection of driving circuits and power lines, allowing for accurate current and voltage measurement and proper power supply.
Engineering Contradictions & Design Principles
Engineering Contradiction Analysis
1Illumination intensity
If the number of light-emitting devices and circuit arrangements is increased to achieve higher display quality, then the display effect is improved, but the difficulty of detection and measurement of current and voltage information increases
Solution Approach 1:
The patent divides the light-emitting substrate into multiple test regions, each equipped with independent test pads and test devices. This segmentation allows for localized detection of current and voltage information in different areas of the substrate, making the detection process more manageable despite the large number of devices. Each test region can be independently monitored, reducing the overall complexity of measurement.
Solution Approach 2:
The patent introduces test pads as intermediary elements between the driving circuits and the measurement system. These test pads serve as access points for external test devices to measure current and voltage without interfering with the normal operation of the light-emitting devices. The test pads act as mediators that enable detection while maintaining the integrity of the display circuitry.
2Quantity of substance
If the mass transfer process is made more complex to accommodate more devices, then the display quality is improved, but the manufacturing difficulty increases
Solution Approach 1:
The substrate is divided into multiple test regions with dedicated test pads and test devices for each region. This segmentation enables modular manufacturing and testing approaches, where each test region can be independently processed and verified. The modular structure simplifies the mass transfer process by allowing standardized procedures to be applied to each segment rather than treating the entire substrate as a single complex unit.
Solution Approach 2:
Test pads and test devices are integrated into the substrate during the manufacturing process before final assembly. This preliminary integration of testing capabilities allows for quality control and verification to be performed early in the manufacturing workflow, identifying defects before they propagate through subsequent processing steps. The test structures are prepared in advance to facilitate efficient mass transfer and assembly operations.
3Measurement precision
If test pads and test devices are added to enable detection, then the measurement capability is improved, but the device complexity increases
Solution Approach 1:
Test pads and test devices are strategically placed in specific test regions rather than being uniformly distributed across the entire substrate. This localized approach concentrates measurement capabilities where they are most needed, enabling precise detection of current and voltage information at critical points without adding complexity to the entire device. Each test region has the necessary measurement components, while other areas maintain simpler structures.
Solution Approach 2:
The test pads are designed to serve multiple functions: they provide electrical connection points for driving circuits, access points for test devices, and reference points for measurements. This multi-functionality reduces the need for separate dedicated test structures, thereby limiting the increase in device complexity while still achieving precise measurement capabilities.
Data Source
AI summary
A light-emitting substrate has a light-emitting region and a test region. A plurality of light-emitting device groups and a plurality of driving circuits are disposed in the light-emitting region. The driving circuits include at least one selected driving circuit, and a selected driving circuit includes at least one first-type output terminal and at least one second-type output terminal. The first-type output terminal is electrically connected to the light-emitting device group. A power line is electrically connected to the light-emitting device groups. A first test pad and a second test pad are disposed in the test region. The first test pad is electrically connected to a second-type output terminal of the selected driving circuit, and the second test pad is electrically connected to the power line. The first test device group is electrically connected to the first test pad and the second test pad.