Light Uniformity Testing via Camera-Based Image Analysis
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Solution Overview
Problem
Existing methods for testing the uniformity of light emitting devices in electronic devices, such as cameras, fail to ensure consistent illumination, leading to non-uniform images and potential discarding of functional devices.
Innovation Solution
A light uniformity testing system that includes a light emitting device, a camera, and a projection surface, using metrics like intensity, centering, color, roll-off, and symmetry to analyze the light beam's uniformity, with options for calibration to compensate for non-uniformity, either by replacing the device or adjusting settings.
Engineering Contradictions & Design Principles
Engineering Contradiction Analysis
1Manufacturing precision
If existing testing methods are used to check light uniformity, then testing can be performed, but the illumination consistency is not ensured and non-uniform images are produced
Solution Approach 1:
The patent replaces subjective visual inspection with automated digital image analysis. A camera captures the light field, and software algorithms automatically analyze uniformity metrics, replacing manual mechanical assessment methods with electronic detection and processing systems.
Solution Approach 2:
The patent introduces a projection surface as an intermediary between the light emitting device and the camera. This surface diffuses the light to create a measurable light field distribution pattern, enabling indirect measurement of light uniformity that would be difficult to assess directly.
2Productivity
If light emitting devices with non-uniform illumination are installed, then device assembly is simplified, but image quality deteriorates and devices may need to be discarded
Solution Approach 1:
The patent performs light uniformity testing before final device assembly or installation. By identifying and filtering out non-uniform light emitting devices in advance, the system prevents defective components from being installed, ensuring only qualified devices proceed to assembly while maintaining high productivity.
Solution Approach 2:
The patent implements a feedback mechanism where test results from light uniformity analysis are used to automatically reject or accept light emitting devices. This closed-loop quality control system provides real-time feedback to the assembly process, ensuring only devices meeting uniformity specifications are installed.
3Measurement precision
If comprehensive uniformity metrics are analyzed, then light emission accuracy is improved, but testing complexity increases
Solution Approach 1:
The patent uses a single camera-based testing system that can evaluate multiple uniformity metrics simultaneously (intensity distribution, color consistency, symmetry, roll-off). This multi-functional approach consolidates what would otherwise require separate specialized instruments into one universal testing platform.
Solution Approach 2:
The patent employs automated image processing algorithms that self-calibrate and self-analyze the captured light field images. The system automatically computes uniformity metrics without requiring manual intervention or complex external calibration equipment, reducing overall system complexity while maintaining high measurement precision.
Data Source
AI summary
Systems and methods for testing a light emitting device are described. A processing device receives a receiving an image of a beam of light substantially free of parallax distortion and determines one or more uniformity metrics of the beam of light based on the received image.