Light Waveform Measurement Using Gas Ionization Yield

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Solution Overview

Problem

Existing light wave measurement methods fail to accurately measure the waveform of a light wave in time domain, are limited by wavelength range when using nonlinear materials, and require complex high harmonic generation and extreme ultraviolet measurement apparatuses.

Innovation Solution

A light wave measurement apparatus that separates an input light wave into two pulses with a predetermined electric field strength ratio, adjusts the time delay between them, and measures ionization yield modulation to derive the waveform, allowing for accurate measurement without wavelength limitations and complex apparatuses.

Engineering Contradictions & Design Principles

VSEngineering Contradiction Analysis

1Measurement precision

If autocorrelation method using nonlinear material is used to measure light wave, then pulse duration information can be obtained, but waveform measurement including phase information cannot be achieved

Engineering Contradiction:
Improvewaveform measurement accuracyVSAvoidphase information loss
Core Design Contradiction:
Measurement precisionVSLoss of information

Solution Approach 1:

The patent introduces a gas medium as an intermediary substance that exhibits nonlinear optical properties. By using gas instead of solid nonlinear crystals, the system can measure both amplitude and phase information of the light wave through ionization yield detection, thereby recovering the complete waveform information that was previously lost

Inventive Principle:
Principle #24Intermediary (Mediator)

Solution Approach 2:

The patent replaces the traditional optical detection method with an ionization-based detection method. Instead of measuring optical signals directly through nonlinear optical processes, the system uses electric field-induced ionization of gas molecules, where the ionization yield serves as a proxy for the light wave's electric field characteristics, enabling complete waveform reconstruction

Inventive Principle:
Principle #28Mechanics substitution (Replace mechanical system)

2Measurement precision

If nonlinear material-based measurement methods (autocorrelation, FROG, SPIDER) are used, then waveform measurement is possible, but the method is limited to specific wavelength ranges due to phase matching conditions

Engineering Contradiction:
Improvewaveform measurement capabilityVSAvoidwavelength range limitation
Core Design Contradiction:
Measurement precisionVSAdaptability or versatility

Solution Approach 1:

The patent employs gas as a universal measurement medium that does not require phase matching conditions. Gas can be used across a broad spectrum of wavelengths without the wavelength-specific constraints of solid nonlinear crystals, making the measurement system universally applicable to different laser wavelengths and extending the versatility of the apparatus

Inventive Principle:
Principle #6Universality (Multi-functionality)

Solution Approach 2:

The patent changes the physical state of the nonlinear material from solid crystal to gas phase. This parameter change eliminates the phase matching constraints that limit solid-state nonlinear optical materials to specific wavelength ranges, allowing the system to operate effectively across a much broader spectral range

Inventive Principle:
Principle #35Parameter changes

3Measurement precision

If high harmonic radiation method is used to measure light wave waveform, then waveform measurement can be achieved, but complicated high harmonic generation and extreme ultraviolet measurement apparatuses are required

Engineering Contradiction:
Improvewaveform measurement capabilityVSAvoidapparatus complexity
Core Design Contradiction:
Measurement precisionVSDevice complexity

Solution Approach 1:

The patent uses gas as a consumable, easily replaceable medium instead of requiring complex, expensive high harmonic generation apparatus. The gas can be简单地 introduced into the measurement chamber and does not require sophisticated infrastructure, significantly reducing the overall system complexity and cost

Inventive Principle:
Principle #27Cheap short-living objects (Disposable)

Solution Approach 2:

The patent extracts the essential measurement function from the complex high harmonic generation system and isolates it to a simple ionization detection process. By separating the waveform measurement function from the complicated harmonic generation apparatus, the system achieves waveform measurement with minimal equipment requirements

Inventive Principle:
Principle #2Taking out (Extraction)

Applied Scientific Principles

This section explains which scientific principles are used to turn an abstract innovation direction into a practical engineering solution.

Function Achieved in This Case

Enables accurate measurement of light wave waveform in time domain without wavelength limitations and with a simple configuration, overcoming the limitations of existing methods.

Implementation Method 1

the fundamental pulse F(t-τ) and the signal pulse S(t) focus on an ionization material to generate electrons and/or ions

Methodology Applied
Scientific EffectIonization: Ionisation

Data Source

PatentEP3382355B1Device and method for measuring waveform of light wave
Publication Date: 2022.12.14 INST FOR BASIC SCI
  • EP3382355B1 patent drawingFigure 1
  • EP3382355B1 patent drawingFigure 2
  • EP3382355B1 patent drawingFigure 3~5

AI summary

The present invention relates to a apparatus and method for measuring a waveform of a light wave. A light wave measurement apparatus according to an embodiment of the present invention includes a pulse separation unit to separate an input light wave into a fundamental pulse and a signal pulse, a time delay adjustment unit to adjust a time delay between the fundamental pulse and the signal pulse, a focusing unit to focus the fundamental pulse and the signal pulse whose time delay is adjusted on an ionization material, and an ionization yield measurement unit to measure an ionization yield from electrons and/or ions generated by the focused fundamental pulse and signal pulse. The waveform of the input light wave is obtained by obtaining an ionization yield modulation changed by the signal pulse as a function of the time delay.