Light-field pixel wavefront detection via intensity normalization

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Solution Overview

Problem

Conventional microscopy techniques, such as phase contrast and DIC microscopy, face challenges in isolating phase information from amplitude information, leading to mixed signals and the inability to provide quantitative phase measurements, and advanced methods require complex optical elements and coherent light sources.

Innovation Solution

A light-field pixel system with an aperture layer containing non-conventional and conventional apertures, where the non-conventional apertures have a higher gradient of transmission at normal incidence, allows for the normalization of light intensities to isolate phase gradients, enabling the detection of wavefronts using a CMOS image sensor array without bulky optical elements.

Engineering Contradictions & Design Principles

VSEngineering Contradiction Analysis

1Measurement precision

If conventional phase contrast or DIC microscopy is used to detect optical phase, then phase information can be obtained, but the phase information is inextricably mixed with amplitude information and quantitative phase measurements cannot be provided

Engineering Contradiction:
Improvephase measurement capabilityVSAvoidamplitude-phase separation
Core Design Contradiction:
Measurement precisionVSLoss of information

Solution Approach 1:

The patent segments the detection of phase and amplitude information by using multiple apertures with different transmission gradients. Each aperture captures a specific component of the light field, allowing separate measurement of phase gradients and amplitude information that can be processed independently to achieve quantitative phase imaging.

Inventive Principle:
Principle #1Segmentation

Solution Approach 2:

Different apertures are designed with specific local properties (different transmission gradients) to capture different aspects of the wavefront. This local differentiation enables selective measurement of phase information while maintaining amplitude information separately, resolving the mixing problem in conventional microscopy.

Inventive Principle:
Principle #3Local quality

2Measurement precision

If advanced full field quantitative phase imaging techniques are used, then quantitative phase information can be provided, but complex optical elements and coherent light sources are required

Engineering Contradiction:
Improvequantitative phase informationVSAvoidoptical elements and light source requirements
Core Design Contradiction:
Measurement precisionVSDevice complexity

Solution Approach 1:

The patent extracts the essential function of wavefront sensing from complex optical interferometry systems by using simple aperture masks with conventional incoherent light sources. This extraction maintains quantitative phase measurement capability while eliminating the need for complex optical elements and coherent light sources.

Inventive Principle:
Principle #2Taking out (Extraction)

Solution Approach 2:

The invention replaces expensive, complex optical components (interferometers, coherent lasers, polarizers) with simple, inexpensive aperture masks that can be fabricated using standard semiconductor manufacturing techniques, dramatically reducing system cost and complexity while maintaining measurement capability.

Inventive Principle:
Principle #27Cheap short-living objects (Disposable)

3Device complexity

If conventional apertures are used in the aperture layer, then the structure is simple, but the gradient of transmission at normal incidence is close to zero

Engineering Contradiction:
Improveaperture structureVSAvoidtransmission gradient
Core Design Contradiction:
Device complexityVSMeasurement precision

Solution Approach 1:

The patent introduces asymmetric aperture designs where the aperture shapes and orientations are specifically engineered to create non-zero transmission gradients at normal incidence. This asymmetry in aperture geometry enables the detection of phase gradients while maintaining structural simplicity suitable for standard manufacturing processes.

Inventive Principle:
Principle #4Asymmetry

Applied Scientific Principles

This section explains which scientific principles are used to turn an abstract innovation direction into a practical engineering solution.

Function Achieved in This Case

This approach enables robust, cost-effective, and simple wavefront detection with high spatial sampling, capable of generating artifact-free phase gradient and intensity images using ordinary illumination, without the need for polarized light, and can be integrated into standard sensor chips.

Implementation Method 1

The aperture layer includes a conventional aperture and a non-conventional aperture. The non-conventional aperture is designed to generate a higher gradient of transmission at normal incidence than the conventional aperture.

Methodology Applied
Scientific EffectLight transmission and modulation: Light

Implementation Method 2

The light detector layer is configured to measure a first intensity of light through the non-conventional aperture and a second intensity of light through the conventional aperture.

Methodology Applied
Scientific EffectPhotoelectric detection: Photoelectric Effect

Data Source

PatentUS8822894B2Light-field pixel for detecting a wavefront based on a first intensity normalized by a second intensity
Publication Date: 2014.09.02 CALIFORNIA INST OF TECH
  • US8822894B2 patent drawing
  • US8822894B2 patent drawing
  • US8822894B2 patent drawing

AI summary

A light-field pixel for detecting a wavefront, the light-field pixel comprises an aperture layer, a light detector layer, and a processor. The aperture layer has a non-conventional aperture and a non-conventional aperture. The non-conventional aperture has a higher gradient of transmission at normal incidence than the conventional aperture. The light detector is configured to measure a first intensity of light through the non-conventional aperture and a second intensity of light through the conventional aperture. The processor is configured to detect the wavefront based on the first intensity normalized by the second intensity.