Lighting System Time-Division Anomaly Detection
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Solution Overview
Problem
Existing lighting systems using semiconductor light-emitting devices cannot individually detect anomalies in the semiconductor laser devices and the light guide member, complicating the configuration and requiring additional photodetectors for identification.
Innovation Solution
A lighting system with a light source, wavelength conversion member, optical system, and optical sensor that uses a time division method to inspect the conditions of the optical system and light source through a monitor signal, allowing for individual detection of anomalies in the light-emitting devices and optical system components.
Engineering Contradictions & Design Principles
Engineering Contradiction Analysis
1Measurement precision
If additional photodetectors are added to detect light from semiconductor laser devices, then anomaly identification capability is improved, but device complexity increases
Solution Approach 1:
The patent segments the inspection process into two distinct phases: optical system inspection and light source inspection. By dividing the inspection function temporally rather than adding separate photodetectors, the system achieves precise anomaly identification without increasing hardware complexity. The single photodetector alternates between detecting optical system conditions and light source conditions through controlled timing sequences.
Solution Approach 2:
The patent implements periodic action by alternating the inspection targets in a time-division manner. The photodetector periodically switches between receiving light for optical system inspection and light for light source inspection. This periodic switching enables the system to identify anomalies in both the optical system and light source using a single photodetector, avoiding the need for multiple simultaneous detection devices.
2Device complexity
If time division method is used for inspection, then device complexity is reduced, but inspection time increases
Solution Approach 1:
The patent employs periodic action through time-division multiplexing of inspection functions. The single photodetector is alternately assigned to optical system inspection and light source inspection in periodic cycles. This approach reduces device complexity by avoiding multiple photodetectors while managing inspection time through structured temporal allocation of detection tasks.
Solution Approach 2:
The patent applies preliminary action by performing optical system inspection before light source inspection in the time-division sequence. This ordering ensures that the optical path and components are verified first, allowing subsequent light source inspection to focus specifically on the light-emitting devices without the complexity of simultaneously monitoring both systems.
Applied Scientific Principles
This section explains which scientific principles are used to turn an abstract innovation direction into a practical engineering solution.
Function Achieved in This Case
Enables simplified configuration and effective individual detection of anomalies in light-emitting devices and optical system components, improving diagnostic capabilities without the need for additional photodetectors.
Implementation Method 1
a wavelength conversion member that converts part of the first light into second light having a different wavelength from a wavelength of the first light
Implementation Method 2
an optical sensor that receives part of the second light as monitor light and outputs a monitor signal corresponding to an intensity of the monitor light
Data Source
AI summary
Lighting system includes light source that includes at least one light-emitting device and emits first light (laser light); wavelength conversion member that converts part of the first light into second light having a different wavelength from that of the first light; an optical system (light guide member) where the first light enters and that applies the first light to wavelength conversion member; optical sensor that receives part of the second light as monitor light and outputs monitor signal corresponding to the intensity of monitor light; and output control circuit that controls light source and optical sensor. Output control circuit performs an optical system inspection of conditions of the optical system and wavelength conversion member and a light source inspection of a condition of light source in accordance with monitor signal, using a time division method.