LIN Master Testing Device Emulating Slave Nodes
Find Innovative SolutionsGenerate Solutions
Solution Overview
Problem
Conventional LIN interfaces are costly and space-intensive, limiting the ability to simultaneously test multiple LIN channels in automotive BCMs, and cannot replicate slave node behavior during master device testing.
Innovation Solution
A testing device with multiple LIN channel terminals and UART circuits that implement LIN slave state machines to emulate slave node behavior, using commercially available UART interfaces like the MAX14830 chip, allowing for simultaneous testing of multiple LIN channels and reducing hardware requirements.
Engineering Contradictions & Design Principles
Engineering Contradiction Analysis
1Productivity
If conventional LIN interfaces are used to test multiple LIN channels simultaneously, then testing capability is provided, but cost and space requirements increase significantly
Solution Approach 1:
The patent applies universality by making a single LIN interface capable of serving multiple functions: it can act as both a master interface for controlling slave nodes and a test interface for verifying master device functionality. The LIN interface is configured to dynamically switch between master and slave roles, allowing one interface to replace what would traditionally require multiple specialized interfaces, thereby reducing both cost and space requirements while maintaining comprehensive testing capability
Solution Approach 2:
The patent employs copying by creating software-based virtual slave nodes that replicate the behavior of physical LIN slave devices. Instead of requiring physical slave nodes for each test scenario, the system uses software emulations that copy slave node functionality, allowing multiple virtual slaves to be managed through a single physical interface. This significantly reduces hardware requirements while preserving full testing capability
2Productivity
If multiple conventional LIN interfaces are deployed to support all LIN channels, then all channels can be tested, but the cumulative cost becomes significant
Solution Approach 1:
The patent implements universality by designing a single LIN interface that can dynamically assume multiple roles (master and slave) and manage multiple virtual slave nodes. This multi-functional interface replaces the need for multiple dedicated interfaces, achieving full channel coverage while dramatically reducing the cumulative cost of hardware deployment
Solution Approach 2:
The patent uses copying by implementing software-based virtual slave nodes that replicate physical slave behavior. These virtual copies allow a single physical interface to manage and test multiple logical channels, achieving comprehensive channel coverage without the prohibitive cost of deploying equivalent physical hardware for each channel
3Productivity
If nine LIN interfaces are used to support thirty-six channels, then full channel support is achieved, but the device occupies considerable space and creates technical issues in high-noise environments
Solution Approach 1:
The patent applies universality by consolidating the functionality of nine separate LIN interfaces into a single multi-functional interface that can dynamically switch between master and slave roles. This single interface manages all thirty-six channels through software-based virtual slave nodes, reducing the physical footprint from nine interface cards to one, thereby minimizing occupied space and reducing noise susceptibility in testing environments
Data Source
Figure 1
Figure 2
Figure 3
AI summary
Testing device for testing a LIN master device (2) having a plurality of LIN channels. The device has a plurality of LIN channel terminals (4), each for connection to a LIN bus (1a-e) associated with one of the LIN channels of the LIN master device (2). One or more UART circuits (13a-b) are communicatively coupled to the plurality of LIN channel terminals (4) for receiving and transmitting signals on the respective LIN bus. A controller (12a-b) is communicatively coupled to the one or more UART circuits (13a-b) and is configured to implement a LIN slave state machine (30) on each of the LIN busses (1a-e) using the one or more UART circuits (4) for emulating LIN slave behaviour.