LiNbO3-on-Silicon Epitaxy Using III-N Nucleation Layers

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Solution Overview

Problem

The production of high-quality lithium niobate thin layers on silicon substrates is challenging due to high manufacturing costs and limited thickness range, hindering the development of multifunctional devices that require co-integration of electro-optical, acoustic, and energy harvesting components.

Innovation Solution

A process involving a refractory nitride-based nucleation layer is used to epitaxially grow a lithium niobate layer directly on a silicon substrate, ensuring stoichiometric and high-crystalline quality, while blocking lithium and oxygen diffusion, thus enabling the formation of thin, high-performance layers for surface acoustic wave devices.

Engineering Contradictions & Design Principles

VSEngineering Contradiction Analysis

1Manufacturing precision

If LiNbO3 thin film is synthesized on sapphire substrates using conventional methods, then high crystalline quality and controlled stoichiometry are achieved, but the manufacturing cost increases and the process complexity increases

Engineering Contradiction:
Improvecrystalline qualityVSAvoidprocess complexity
Core Design Contradiction:
Manufacturing precisionVSDevice complexity

Solution Approach 1:

A nucleation layer is introduced as an intermediary between the silicon substrate and the LiNbO3 thin film. This nucleation layer facilitates epitaxial growth of high-quality LiNbO3 on silicon substrates, enabling direct synthesis without complex transfer processes from sapphire substrates while maintaining crystalline quality and stoichiometry control

Inventive Principle:
Principle #24Intermediary (Mediator)

Solution Approach 2:

The invention creates a simplified process by directly synthesizing LiNbO3 thin films on silicon substrates through epitaxial growth, copying the successful crystalline quality achievement from sapphire-based methods but implementing it through a different, less complex direct synthesis pathway that eliminates transfer steps

Inventive Principle:
Principle #26Copying

2Adaptability or versatility

If LiNbO3 thin film is transferred from donor substrate to silicon substrate, then silicon-based substrate compatibility is improved, but the manufacturing cost increases and the achievable thickness range is limited

Engineering Contradiction:
Improvesubstrate compatibilityVSAvoidprocess complexity
Core Design Contradiction:
Adaptability or versatilityVSDevice complexity

Solution Approach 1:

The invention extracts the essential function of substrate compatibility by directly synthesizing LiNbO3 on silicon substrates with appropriate nucleation layers, eliminating the need for complex transfer processes from donor substrates. This approach achieves substrate compatibility through direct epitaxial growth rather than physical transfer

Inventive Principle:
Principle #2Taking out (Extraction)

Solution Approach 2:

A nucleation layer serves as an intermediary that enables direct epitaxial growth of LiNbO3 on silicon substrates, achieving substrate compatibility without requiring transfer processes. The nucleation layer mediates the interface between silicon and LiNbO3, allowing direct synthesis while maintaining material quality

Inventive Principle:
Principle #24Intermediary (Mediator)

3Manufacturing precision

If rare-earth oxide buffer layer is formed on silicon substrate before epitaxial deposition, then LiNbO3 layer formation is enabled, but the manufacturing cost remains high and process complexity increases

Engineering Contradiction:
Improveepitaxial growth qualityVSAvoidprocess complexity
Core Design Contradiction:
Manufacturing precisionVSDevice complexity

Solution Approach 1:

The invention changes the material parameter of the buffer layer from rare-earth oxide to nitride-based refractory material. This parameter change maintains the ability to support epitaxial growth of high-quality LiNbO3 on silicon substrates while simplifying the process and reducing manufacturing costs associated with rare-earth materials

Inventive Principle:
Principle #35Parameter changes

Applied Scientific Principles

This section explains which scientific principles are used to turn an abstract innovation direction into a practical engineering solution.

Function Achieved in This Case

This approach reduces production costs and enhances compatibility, allowing for the direct integration of high-frequency SAW filters and other devices on silicon substrates with improved crystalline quality and acoustic wave confinement.

Implementation Method 1

Being able to block the diffusion of Li atoms into Si. This prevents a loss of stoichiometry in the LN/LT layer.

Methodology Applied
Scientific EffectDiffusion barrier: Diffusion Barrier

Implementation Method 2

Form the LN/LT layer on the nucleation layer by epitaxy

Methodology Applied
Scientific EffectEpitaxy: Epitaxy

Implementation Method 3

Confining an acoustic wave, particularly to ensure high performance for electroacoustic devices.

Methodology Applied
Scientific EffectAcoustic wave confinement:

Implementation Method 4

Resonators based on a surface acoustic wave (SAW) structure have historically been used to create RF filters. The core of SAW resonators is composed of a piezoelectric material that influences the final properties of the filter.

Methodology Applied
Scientific EffectPiezoelectric effect: Piezoelectric Effect

Data Source

PatentEP4192221A1Method of forming piezoelectric material layer and surface acoustic wave device using the same
Publication Date: 2023.06.07 COMMISSARIAT A LENERGIE ATOMIQUE ET AUX ENERGIES ALTERNATIVES
  • EP4192221A1 patent drawingFigure 1A~1B
  • EP4192221A1 patent drawingFigure 2~3
  • EP4192221A1 patent drawingFigure 4~5

AI summary

The invention relates to a method for forming a layer (30) based on lithium niobate or lithium tantalate, called an LN/LT layer, comprising the following steps: - Providing a silicon-based substrate (10), - Forming a nucleation layer (20) on the substrate (10), - Forming the LN/LT layer (30) by epitaxy on the nucleation layer (20). The method is characterized in that the nucleation layer (20) is chosen to be based on a III-N material. The invention also relates to a surface acoustic wave device (1) comprising such a nucleation layer (20).