Line Focus X-ray Source for CT and Diffraction Switching
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Solution Overview
Problem
The high cost of medical computed tomography apparatus limits its use, and existing technologies do not efficiently allow for switching between computed tomography and other X-ray applications like X-ray diffraction without extensive recalibration.
Innovation Solution
Using a line focus configuration in X-ray apparatus for computed tomography, which enables rapid switching to X-ray diffraction without recalibration and allows for improved resolution with reasonable power, by employing conventional cone beam computed tomography algorithms after scaling two-dimensional images.
Engineering Contradictions & Design Principles
Engineering Contradiction Analysis
1Measurement precision
If a spot focus is used to achieve good resolution, then resolution is improved, but measurement time increases significantly due to very low intensity
Solution Approach 1:
The patent transitions from a conventional point focus to a line focus configuration, effectively adding a dimensional element to the X-ray source. This line focus extends in one dimension while maintaining sharpness in the perpendicular dimension, allowing sufficient X-ray intensity across the sample width while preserving resolution in the critical measurement direction, thus reducing measurement time without sacrificing resolution.
2Measurement precision
If dedicated computed tomography apparatus is used, then imaging capability is improved, but cost increases significantly
Solution Approach 1:
The patent enables conventional X-ray diffraction apparatus to perform computed tomography measurements by introducing a line focus configuration and applying appropriate reconstruction algorithms. This allows a single apparatus to serve multiple functions - both traditional XRD and CT imaging - eliminating the need for separate dedicated CT equipment and reducing overall cost while maintaining imaging capability.
3Adaptability or versatility
If apparatus switches between computed tomography and X-ray diffraction, then versatility is improved, but recalibration time increases
Solution Approach 1:
The patent establishes a line focus configuration that serves as a preliminary setup enabling both XRD and CT measurements. By pre-configuring the X-ray source as a line focus and having the reconstruction algorithm ready to process the specific geometric arrangement, the apparatus can switch between modes without requiring extensive recalibration, as the fundamental optical geometry remains valid for both applications.
Applied Scientific Principles
This section explains which scientific principles are used to turn an abstract innovation direction into a practical engineering solution.
Function Achieved in This Case
This approach reduces the complexity of calculations, achieves higher resolution, and allows for efficient use of existing X-ray equipment for both computed tomography and diffraction measurements, optimizing resource utilization and reducing measurement time.
Implementation Method 1
an X-ray source for generating a beam of X-rays
Implementation Method 2
an X-ray optic behind the X-ray tube that is creating a line focus of X-rays extending linearly in a first direction
Implementation Method 3
a two-dimensional detector for detecting X-rays from the X-ray source having passed through a sample on the sample stage and generating a two-dimensional image
Data Source
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AI summary
Apparatus for computed tomography is described that is also suitable for X-ray diffraction. The computed tomography measurement uses a line focus 8 and passes the X-rays from the line focus through a perpendicular slit 22 and then through a sample onto a two dimensional detector. A plurality of images are taken, each with the sample rotated about a rotation axis 14 by a different amount, and combined to create a computed tomography image.