Linear Camera Optical Defect Detection for Glass Substrates
Find Innovative SolutionsGenerate Solutions
Solution Overview
Problem
Current methods for detecting optical defects in transparent substrates are ineffective, imprecise, and costly, particularly when applied to continuously produced materials like glass, as they require stopping the production line, are labor-intensive, and struggle with medium or low-intensity defects.
Innovation Solution
A device comprising an oblong target support with a periodic pattern and a linear camera that illuminates and captures images of the substrate in transmission, allowing for real-time analysis of optical power and defect detection without the need for precise alignment or stopping the production line, using a mechanical system to adjust the target's distance for sensitivity and a backlighting system for efficient defect mapping.
Engineering Contradictions & Design Principles
Engineering Contradiction Analysis
1Measurement precision
If transmission measurement techniques with two-dimensional patterns are used to detect optical defects, then measurement precision is improved, but device complexity and alignment requirements increase significantly
Solution Approach 1:
The patent divides the two-dimensional pattern into multiple one-dimensional linear patterns arranged in parallel. Each linear pattern can be independently analyzed by the linear camera, simplifying the measurement approach while maintaining comprehensive defect detection capability across the substrate surface.
Solution Approach 2:
The patent transitions from analyzing two-dimensional patterns with two-dimensional cameras to using one-dimensional linear patterns with linear cameras. This dimensional reduction simplifies the alignment requirements and data processing while preserving the ability to detect optical defects through transmission measurements.
2Ease of operation
If visual analysis or line shadowgraphy techniques are used to detect optical defects, then ease of operation is improved, but measurement precision and detection capability deteriorate
Solution Approach 1:
The patent replaces subjective visual analysis with automated optical transmission measurements using a linear camera and systematic image processing. This substitution provides objective, quantitative defect detection with precise intensity measurements while maintaining operational simplicity through automated analysis algorithms.
3Loss of time
If sampling methods are used to control optical defects, then loss of time is reduced, but reliability and exhaustiveness of control deteriorate
Solution Approach 1:
The patent enables continuous defect detection by using a linear camera that can scan across the substrate surface while it moves through the production line. The systematic acquisition of linear images along the substrate length provides continuous monitoring without interrupting production, ensuring both time efficiency and comprehensive defect coverage.
Applied Scientific Principles
This section explains which scientific principles are used to turn an abstract innovation direction into a practical engineering solution.
Function Achieved in This Case
Enables rapid, precise, and cost-effective detection and quantification of optical defects on continuously moving substrates, reducing production line downtime and improving quality control by providing real-time 2D maps of defects without the need for extensive recalibration or modification of existing industrial lines.
Implementation Method 1
a system for illuminating the pattern... take, with the aid of the linear camera, a linear image in transmission of the illuminated pattern
Implementation Method 2
The optical defects of transparent substrates are characterized by the optical deformations they cause when these substrates are in use
Data Source
Figure 1~3
AI summary
This device (1) for analyzing a transparent surface of a substrate (2) comprises a gauge (10) disposed facing the surface of the substrate to be measured. The gauge is formed on a support (11) of small and large extensions. A camera (3) is provided so as to take at least one image of the gauge deformed by the measured substrate. A system (4) for illuminating the gauge and means (5) for processing the image and for numerical analysis are linked to the camera (3). The support (11) is of oblong form, the gauge is monodirectional, consisting of a pattern (10) which extends along the smallest extension of the support. The pattern (10) is periodic transversely to the small extension, and the camera is linear.