Linear Combination Test Input for Fault Detection
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Solution Overview
Problem
Conventional fault-based technologies require duplicate circuits to detect faults in electronic devices, leading to increased circuit size and cost, and inefficient use of valuable die area.
Innovation Solution
A method that applies a test input signal comprising a linear combination of inputs to a system, comparing the sum of the test output and a linear combination of outputs to a defined precision level to detect faults, thereby conserving circuit area and efficiently identifying circuit faults.
Engineering Contradictions & Design Principles
Engineering Contradiction Analysis
1Reliability
If duplicate circuits are used for fault detection, then fault detection capability is improved, but circuit size and cost increase
Solution Approach 1:
The patent combines the fault detection function with the existing operational circuits by using the same circuit to process both normal inputs and test inputs. The circuit performs dual purposes: normal operation and self-diagnosis, eliminating the need for separate duplicate circuits dedicated solely to fault detection.
Solution Approach 2:
The patent makes the existing circuit universal by enabling it to perform multiple functions: processing normal operational inputs and processing test inputs for fault detection. The same circuit infrastructure is used for both operational and diagnostic purposes, maximizing resource utilization.
2Reliability
If duplicate circuits are used for fault detection, then fault detection capability is improved, but manufacturing cost increases
Solution Approach 1:
The patent merges the fault detection functionality into the existing circuit design, so that the same hardware performs both operational and diagnostic functions. This consolidation reduces the total component count and simplifies manufacturing processes.
Solution Approach 2:
The patent implements self-diagnosis capability where the circuit tests itself using its own infrastructure. The circuit processes test inputs and evaluates its own operational status without requiring external duplicate testing equipment, reducing manufacturing complexity and cost.
3Reliability
If duplicate circuits are used for fault detection, then fault detection capability is improved, but die area efficiency decreases
Solution Approach 1:
The patent combines fault detection operations with normal circuit operations within the same physical circuit space. By using the same circuit elements for both operational and diagnostic purposes, the patent maximizes the utilization of die area and avoids wasting valuable real estate on redundant components.
Data Source
AI summary
Facilitating fault detection of a system using a test input including a linear combination of inputs of the system is presented herein. A test signal component generates, via a test procedure, a test input signal including a first linear combination of at least two input signals of the system, and applies the test input signal to the system during a phase of respective phases of the test procedure; and a fault detection component detects a fault of the system based on a test output signal corresponding to the test input signal and a second linear combination of respective output signals of the system corresponding to the at least two input signals.