Linear Program Solver for IC Test Subset Selection
Find Innovative SolutionsGenerate Solutions
Solution Overview
Problem
The time required to test integrated circuits is a significant contributor to production costs and can limit the capacity of production facilities, as existing testing methods are inefficient and often require redundant tests.
Innovation Solution
A method utilizing linear programming to select an optimal set of tests from a larger suite, minimizing test time while adhering to a predetermined defective parts budget, by applying a linear program solver to identify a subset of tests that reduce testing time without compromising defect detection.
Engineering Contradictions & Design Principles
Engineering Contradiction Analysis
1Reliability
If a comprehensive set of tests is applied to ensure high defect detection accuracy, then the reliability of defect detection is improved, but the test time increases significantly
Solution Approach 1:
The patent segments the comprehensive test suite into multiple groups and uses linear programming to select an optimal subset of tests that achieves acceptable defect detection accuracy with reduced test time. The test suite is divided into individual test cases that can be independently selected and executed.
Solution Approach 2:
The patent changes the parameter of test selection from exhaustive to optimized subset by applying linear programming. The objective function and constraints are formulated to minimize test time while maintaining acceptable defect detection accuracy, transforming the test execution parameters through mathematical optimization.
2Manufacturing precision
If more tests are performed to reduce defective devices passing, then the manufacturing precision is improved, but the productivity decreases
Solution Approach 1:
The patent applies partial action by selecting a subset of tests rather than executing all available tests. The linear programming model determines the minimum necessary tests to achieve acceptable quality levels, performing only the essential testing needed to maintain manufacturing precision while improving productivity.
Solution Approach 2:
The patent formulates a linear programming model that changes the testing parameter from comprehensive coverage to optimized coverage. The objective function minimizes test time while constraints ensure that the number of defective devices passing remains within acceptable limits, balancing precision and productivity.
3Loss of time
If the test suite is reduced to minimize test time, then the loss of time is reduced, but the reliability of defect detection deteriorates
Solution Approach 1:
The patent uses linear programming to optimally change the test suite parameters. The objective function minimizes test time while constraints ensure that defect detection reliability remains above acceptable thresholds. This mathematical optimization finds the best balance between speed and accuracy.
Solution Approach 2:
The patent incorporates feedback mechanisms where test results from initial testing phases inform the selection of subsequent tests. The linear programming model uses historical test data and defect patterns to dynamically adjust the test subset selection, maintaining reliability while reducing time.
Data Source
AI summary
A system and method for reducing device test time are disclosed herein. A method for reducing device test time includes applying a linear program solver to select a first set of tests for testing a device from a second set of tests for testing the device. The first set of tests is selected to reduce the time required to test the device while allowing no more than a predetermined number of devices tested to pass the first set of tests and fail the second set of tests.