Liquid-Cooled Test Socket Assemblies for Semiconductor ICs
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Solution Overview
Problem
Conventional test socket assemblies for semiconductor integrated circuit (IC) chips face degradation due to repeated heating and deformation, especially at contact points between the IC chip and the test socket assembly, leading to reduced reliability and lifespan, as they are typically made from thermally nonconductive materials that cannot effectively dissipate the high heat generated during high-performance testing.
Innovation Solution
A liquid-cooled test socket assembly with a metallic frame and cartridge body, featuring channels for fluid circulation to improve heat transfer, which includes removing insulation layers at strategic points to enhance thermal conductivity without compromising electrical performance, and using thermal grease to eliminate air gaps for better heat dissipation.
Engineering Contradictions & Design Principles
Engineering Contradiction Analysis
1Reliability
If thermally nonconductive materials are used for the test socket assembly, then electrical insulation is improved, but heat dissipation capability deteriorates
Solution Approach 1:
The test socket assembly is divided into distinct functional zones: electrically insulating regions (frame body, cartridge body) and thermally conductive regions (metallic inserts at contact points). This segmentation allows each zone to perform its specialized function without compromising the other, resolving the contradiction between electrical insulation and heat dissipation.
Solution Approach 2:
The patent applies different material properties to different locations within the assembly. Thermally conductive metallic inserts are strategically placed only at contact points where heat generation occurs, while the bulk of the assembly maintains electrically insulating properties. This local differentiation resolves the contradiction by providing heat dissipation exactly where needed without sacrificing overall electrical insulation.
2Productivity
If repeated testing cycles are performed, then productivity is improved, but thermal degradation and deformation increase
Solution Approach 1:
The patent preemptively addresses thermal degradation by incorporating thermally conductive metallic inserts into the contact points before testing begins. These inserts act as heat sinks that prevent excessive temperature buildup during repeated testing cycles, cushioning the assembly against thermal degradation and deformation that would otherwise limit productivity.
Solution Approach 2:
The patent converts the harmful effect of heat generation during testing into a beneficial outcome. By providing efficient thermal conduction paths through metallic inserts, the heat that would cause degradation is instead channeled away from sensitive components, allowing repeated testing cycles to proceed without compromising reliability. The heat, rather than being a limiting factor, becomes manageable and even useful for maintaining contact integrity.
3Temperature
If thermally conductive materials are used at contact points, then heat dissipation is improved, but electrical insulation deteriorates
Solution Approach 1:
The contact point region is segmented into a thermally conductive metallic insert embedded within an electrically insulating matrix or housing. This segmentation allows the metallic portion to conduct heat away from the IC chip contact area while the surrounding insulating material maintains electrical isolation, resolving the contradiction between thermal conduction and electrical insulation at the same location.
Solution Approach 2:
The patent employs composite construction at contact points, combining thermally conductive metallic materials with electrically insulating materials in a unified structure. This composite approach allows both thermal and electrical requirements to be satisfied simultaneously within the same component, eliminating the need to choose between contradictory material properties.
Applied Scientific Principles
This section explains which scientific principles are used to turn an abstract innovation direction into a practical engineering solution.
Function Achieved in This Case
The solution effectively dissipates heat from contact points, improving the reliability and lifespan of the test socket assembly, maintaining consistent performance even with repeated use and high-frequency signal transmission, thereby reducing maintenance and downtime.
Implementation Method 1
A liquid-cooled test socket assembly with a metallic frame and cartridge body, featuring channels for fluid circulation to improve heat transfer
Implementation Method 2
channels defining a fluid path
Implementation Method 3
using thermal grease to eliminate air gaps for better heat dissipation
Implementation Method 4
A liquid-cooled test socket assembly with a metallic frame and cartridge body
Data Source
AI summary
A socket assembly with liquid cooling frame for a semiconductor integrated circuit (IC) chip is provided. The socket assembly includes a liquid cooling socket frame including a metallic frame body defining an opening sized to receive the semiconductor IC chip, wherein the frame body includes one or more channels transversely positioned through the frame body and positioned in an interior of the frame body, the channels defining a fluid path. The socket assembly also includes a socket cartridge including a metallic cartridge body defining a plurality of cavities each sized to receive a test probe therein, the socket frame covering a portion of the socket cartridge and exposing the plurality of cavities at the opening.


