Liquid Crystal Substrate Alignment Inspection System
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Solution Overview
Problem
Large liquid crystal display substrates tend to bend and deform during alignment checking, leading to poor electrical contact and inaccurate alignment determination due to the existing inspecting apparatus design.
Innovation Solution
An alignment inspecting system with corner-mounted mechanisms, including horizontal alignment devices and flattening devices with solenoid valves, applies pressure to the substrate edges to prevent bending and deformation, ensuring consistent contact between probes and the substrate.
Engineering Contradictions & Design Principles
Engineering Contradiction Analysis
1Measurement precision
If the liquid crystal substrate is fed into the inspecting apparatus for alignment checking, then the alignment can be inspected, but the substrate bends and deforms during the process
Solution Approach 1:
The patent applies preliminary anti-action by using alignment mechanisms at the four corners to exert pressure on the substrate edges before inspection begins, preventing bending and deformation during the alignment checking process
Solution Approach 2:
The patent changes the physical state of the substrate by applying pressure through alignment mechanisms, transforming the substrate from a bent state to a flattened state, thereby maintaining proper shape during inspection
2Measurement precision
If the voltage supplier is moved upward to inspect the substrate, then the inspection can be performed, but poor electrical contact occurs between the probe and the substrate
Solution Approach 1:
The alignment mechanisms preemptively flatten the substrate before the voltage supplier moves upward, ensuring that when electrical contact is made, the substrate surface is flat and proper contact is maintained throughout the inspection process
3Device complexity
If the substrate is inspected without alignment correction, then the inspection process is simple, but incorrect reading and inaccurate determination occur
Solution Approach 1:
The patent divides the inspection system into separate functional modules: alignment mechanisms at the corners for shape correction, and the main inspection apparatus for alignment checking. This segmentation allows each component to perform its specific function effectively
Solution Approach 2:
The alignment mechanisms perform preliminary action by correcting the substrate shape before the main inspection process begins, ensuring accurate readings without complicating the overall inspection procedure
Applied Scientific Principles
This section explains which scientific principles are used to turn an abstract innovation direction into a practical engineering solution.
Function Achieved in This Case
The system effectively corrects substrate bending, maintaining proper contact and reducing incorrect readings during alignment inspection.
Implementation Method 1
a horizontal alignment device for exerting pressure to edges of the substrate
Implementation Method 2
a flattening device for applying longitudinal pressure to the substrate
Implementation Method 3
the first control device is a solenoid valve... the second control device is a solenoid valve
Data Source
AI summary
The present invention relates to an alignment inspecting system for liquid crystal substrate, comprises an alignment mechanism located on corners of the substrate, and the alignment mechanism including a horizontal alignment device for exerting pressure to edges of the substrate, wherein a flattening device for applying longitudinal pressure to the substrate is further included. The present invention can be concluded with the following advantages: this alignment inspecting system for liquid crystal substrate can be used to correct the bending of the substrate during alignment process, so as to reduce the bending and deformation of the substrate which in turn creates poor contact between the probe and the substrate. As a result, incorrect reading can be avoided.