Lithographic Encoder Target Recess and Thermal Management
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Solution Overview
Problem
The increasing demands for accuracy and stability in lithographic apparatuses, particularly due to larger substrate handling and thermal expansion issues, compromise the positioning accuracy of encoder type sensor systems used in lithographic processes.
Innovation Solution
Incorporating a recess to accommodate the encoder sensor target, providing a gas stream to stabilize temperature, using a heat shielding layer, and employing materials with zero thermal expansion or high thermal conductivity to minimize temperature effects on measurement accuracy.
Engineering Contradictions & Design Principles
Engineering Contradiction Analysis
1Adaptability or versatility
If the encoder sensor target size is increased to handle larger substrates and provide increased substrate handling flexibility, then substrate handling capability is improved, but thermal expansion effects and positioning accuracy deteriorate
Solution Approach 1:
The patent changes the material parameter of the encoder sensor target by using materials with zero or low thermal expansion coefficients. This allows the target to maintain dimensional stability and measurement precision even when the target size is increased for larger substrate handling capability.
Solution Approach 2:
The patent employs composite material structures for the encoder sensor target, combining materials with complementary properties including zero thermal expansion, high thermal conductivity, and high stiffness. This composite approach enables large target sizes for versatile substrate handling while maintaining nanometer-level positioning accuracy through superior thermal and mechanical stability.
2Ease of manufacture
If common encoder sensor target materials are used, then ease of manufacture is improved, but temperature stability must be controlled within milli Kelvins to achieve one nanometer stability
Solution Approach 1:
The patent fundamentally changes the thermal parameter of the encoder sensor target material by selecting materials with zero or low thermal expansion coefficients and high thermal conductivity. This parameter change eliminates the need for extreme temperature control (milli Kelvin stability), making the system both easier to manufacture and more stable thermally.
Solution Approach 2:
The patent directly addresses thermal expansion effects by using materials specifically selected for their zero or low thermal expansion properties. This eliminates the harmful thermal expansion that would otherwise require extreme temperature control, thereby improving both manufacturing ease and temperature stability.
3Adaptability or versatility
If the range of movement of the substrate table is increased to provide increased flexibility in substrate handling, then substrate handling flexibility is improved, but the size of the encoder sensor target must be increased which aggravates thermal effects
Solution Approach 1:
The patent changes the thermal parameters of the encoder sensor target material (zero thermal expansion coefficient, high thermal conductivity) to enable large target sizes required for increased substrate table movement range without suffering from aggravated thermal effects.
Solution Approach 2:
The patent uses composite materials with optimized thermal and mechanical properties to construct large encoder sensor targets that can accommodate increased substrate table movement ranges while resisting thermal deformation and maintaining measurement accuracy.
Applied Scientific Principles
This section explains which scientific principles are used to turn an abstract innovation direction into a practical engineering solution.
Function Achieved in This Case
These measures enhance the stability and accuracy of position measurements, allowing for increased substrate handling flexibility and maintaining high precision in nanometer-scale stability.
Implementation Method 1
providing a gas stream to stabilize temperature
Implementation Method 2
using a heat shielding layer
Implementation Method 3
employing materials with zero thermal expansion or high thermal conductivity
Implementation Method 4
employing materials with zero thermal expansion or high thermal conductivity
Data Source
AI summary
A lithographic apparatus is disclosed that includes an encoder type sensor system configured to measure a position of a substrate table of the lithographic apparatus relative to a reference structure. The encoder type sensor system includes an encoder sensor head and an encoder sensor target and the lithographic apparatus comprises a recess to accommodate the encoder sensor target.


