Lithographic Substrate Table Thermal Drift Control

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Solution Overview

Problem

Lithographic processes face inaccuracies due to thermal drift of substrates between alignment measurement and exposure, causing misalignment and overlay errors.

Innovation Solution

Applying heat to the substrate table between alignment measurement and exposure to stabilize and maintain temperature, reducing thermal drift through controlled heating elements and feedback loops.

Engineering Contradictions & Design Principles

VSEngineering Contradiction Analysis

1Temperature

If the substrate table is cooled by the cooling system, then the substrate table temperature is reduced, but thermal drift occurs causing misalignment between alignment measurement and lithographic exposure

Engineering Contradiction:
Improvesubstrate table temperatureVSAvoidalignment accuracy
Core Design Contradiction:
TemperatureVSManufacturing precision

Solution Approach 1:

The patent applies heat to the substrate table in advance between alignment measurement and lithographic exposure to counteract the cooling effect. This preliminary heating action ensures that the substrate table temperature stabilizes before exposure, preventing thermal drift and maintaining alignment accuracy despite the cooling system being active during the process

Inventive Principle:
Principle #10Preliminary action

2Manufacturing precision

If heat is applied to the substrate table to reduce thermal drift, then alignment accuracy is improved, but the cooling system effectiveness is reduced

Engineering Contradiction:
Improvealignment accuracyVSAvoidcooling efficiency
Core Design Contradiction:
Manufacturing precisionVSLoss of energy

Solution Approach 1:

The patent implements periodic heating cycles where heat is applied to the substrate table at specific intervals between alignment measurement and exposure. This periodic heating compensates for thermal drift only when necessary, allowing the cooling system to remain effective during other periods, thus balancing alignment accuracy with cooling efficiency

Inventive Principle:
Principle #19Periodic action

3Stability of the object's composition

If the substrate table temperature is stabilized through heat application, then thermal drift is reduced, but process complexity increases due to additional heating control

Engineering Contradiction:
Improvesubstrate table temperature stabilityVSAvoidheating control system
Core Design Contradiction:
Stability of the object's compositionVSDevice complexity

Solution Approach 1:

The patent employs a feedback control system that monitors substrate table temperature and automatically adjusts heating power accordingly. Temperature sensors detect thermal drift, and the control system modulates heating element power to maintain temperature stability, eliminating the need for complex manual intervention while ensuring consistent alignment accuracy

Inventive Principle:
Principle #23Feedback

Applied Scientific Principles

This section explains which scientific principles are used to turn an abstract innovation direction into a practical engineering solution.

Function Achieved in This Case

This approach enhances the accuracy of lithographic exposures by maintaining alignment marks closer to their measured positions, reducing thermal drift and overlay errors.

Implementation Method 1

applying heat to the substrate table to reduce cooling of the substrate table provided by the cooling system

Methodology Applied
Scientific EffectThermal conduction: Conduction (thermal)

Implementation Method 2

the substrate table comprising a cooling system operative to cool the substrate table

Methodology Applied
Scientific EffectThermal conduction: Conduction (thermal)

Data Source

PatentUS10775707B2Lithographic apparatus and method
Publication Date: 2020.09.15 ASML NETHERLANDS BV
  • US10775707B2 patent drawing
  • US10775707B2 patent drawing
  • US10775707B2 patent drawing

AI summary

A method of performing a lithographic exposure of a substrate, the substrate being held on a substrate table, the substrate table comprising a cooling system operative to cool the substrate table, the method comprising performing an alignment measurement of the substrate, applying heat to the substrate table to reduce cooling of the substrate table provided by the cooling system, the heat being applied between a time at which the alignment measurement is performed and a time at which the lithographic exposure is performed and performing the lithographic exposure of the substrate.