Lithography Mirror Cooling Bypass for Flow Vibration Isolation

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Solution Overview

Problem

Existing projection exposure apparatuses for semiconductor lithography face challenges in maintaining imaging quality due to flow-induced vibrations in fluid channels, which cause mirror deformations and positional changes, leading to disturbances in the imaging process.

Innovation Solution

A projection exposure apparatus with a fluid channel connected to a supply line and outgoing line via a short circuit, which equalizes pressure differences and absorbs disturbances, reducing mirror displacements and deformations by decoupling the flow-induced vibrations.

Engineering Contradictions & Design Principles

VSEngineering Contradiction Analysis

1Temperature

If water cooling is used to regulate mirror temperature, then thermal load is dissipated effectively, but flow-induced vibrations cause mirror deformations and positional changes

Engineering Contradiction:
Improvemirror temperatureVSAvoidimaging quality
Core Design Contradiction:
TemperatureVSManufacturing precision

Solution Approach 1:

A vibration isolation table is introduced as an intermediary component between the mirror and the fluid channel assembly. This table acts as a mechanical filter that decouples the mirror from vibration sources generated by fluid flow in the channels, allowing effective heat dissipation while preventing transmission of flow-induced vibrations to the optical element

Inventive Principle:
Principle #24Intermediary (Mediator)

Solution Approach 2:

The design modifies the physical parameters of the fluid channel system by optimizing channel geometry, flow velocity, and pressure characteristics to minimize vibration generation. Additionally, the vibration isolation table introduces damping parameters that reduce the amplitude of transmitted vibrations, thereby resolving the contradiction between effective cooling and imaging precision

Inventive Principle:
Principle #35Parameter changes

2Reliability

If fluid channels are integrated into mirrors for cooling, then temperature regulation is achieved, but mechanical disturbances from flow-induced vibrations increase

Engineering Contradiction:
Improvetemperature regulationVSAvoidflow-induced vibrations
Core Design Contradiction:
ReliabilityVSObject-affected harmful factors

Solution Approach 1:

The vibration isolation table serves as a mediator that separates the mirror from the fluid channel assembly. This intermediary structure allows the fluid channels to maintain close thermal coupling with the mirror for effective cooling while mechanically isolating the mirror from harmful vibrations generated by fluid flow

Inventive Principle:
Principle #24Intermediary (Mediator)

Solution Approach 2:

The harmful vibration-generating fluid channel assembly is extracted and separated from the mirror structure. The channels are positioned in close proximity for thermal coupling but mechanically decoupled through the vibration isolation table, extracting the harmful vibrational effects while retaining the beneficial cooling function

Inventive Principle:
Principle #2Taking out (Extraction)

Applied Scientific Principles

This section explains which scientific principles are used to turn an abstract innovation direction into a practical engineering solution.

Function Achieved in This Case

The solution effectively minimizes mechanical disturbances caused by flow-induced vibrations, improving imaging quality by maintaining the optical effective surface stability of mirrors.

Implementation Method 1

The mirrors can comprise fluid channels through which temperature-regulated water flows and which thereby can dissipate the heat from the optical effective surface

Methodology Applied
Scientific EffectHeat dissipation through fluid flow: Convection

Implementation Method 2

the supply line and the outgoing line being connected to one another in parallel with the fluid channel via a short circuit

Methodology Applied
Scientific EffectPressure equalization: Pascal's Law

Data Source

PatentUS12547086B2Projection exposure apparatus for semiconductor lithography
Publication Date: 2026.02.10 CARL ZEISS SMT GMBH
  • US12547086B2 patent drawing
  • US12547086B2 patent drawing
  • US12547086B2 patent drawing

AI summary

A projection exposure apparatus for semiconductor lithography includes component having a fluid channel and a device for providing a fluid for flowing through the fluid channel. The fluid channel is connected to the device via a supply line and an outgoing line. The supply line and the outgoing line are connected to one another in parallel with the fluid channel via a short circuit.