LLM-Based Test Planning for Electronic Device Verification
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Solution Overview
Problem
The lack of cohesive structure in electronic equipment design and testing methodologies leads to inconclusive tests, inefficiencies, and increased error risk due to reliance on diverse tools and personal experience, making it difficult to optimize resource usage and trace outcomes effectively.
Innovation Solution
A system utilizing a large language model (LLM) to plan and execute tests by receiving user inputs, determining test plans, analyzing measurements, and generating reports, thereby integrating diverse tools and enhancing traceability and efficiency.
Engineering Contradictions & Design Principles
Engineering Contradiction Analysis
1Adaptability or versatility
If engineers use diverse methodologies and tools for testing, then they can address different testing needs, but the lack of cohesive structure leads to inconclusive tests and increased error risk
Solution Approach 1:
The patent segments the testing process into distinct phases: test planning, test execution, and result analysis. Each phase is handled by specialized components (test plan generator, measurement execution module, result analyzer), allowing diverse methodologies to be applied appropriately at each stage while maintaining overall coherence and reliability through structured integration.
2Ease of operation
If engineers manually integrate tools and execute intricate designs, then they can adapt to project requirements, but error risk and oversights increase
Solution Approach 1:
The system enables self-service through automated test plan generation based on device specifications, automatic measurement execution through integrated instruments, and automated result analysis. This reduces manual intervention in error-prone areas while maintaining flexibility through configurable test parameters and adaptive measurement selection, thereby lowering error risk without sacrificing operational ease.
3Productivity
If engineers work independently at each process stage, then they can focus on specific tasks, but integration becomes complex and traceability becomes difficult
Solution Approach 1:
The patent implements feedback mechanisms where measurement results automatically feed back into the analysis phase, and test plan adjustments are communicated back to execution. The system maintains traceability through structured data flow between phases, where each phase's output becomes the input for the next phase, ensuring continuous information flow while allowing independent work at each stage.
4Ease of manufacture
If engineers rely on personal or company experience for optimization, then they can make quick decisions, but product parameters are frequently adjusted on-the-fly reducing consistency
Solution Approach 1:
The system performs preliminary action by automatically generating test plans based on predefined device specifications and requirements before execution begins. This pre-planning establishes consistent parameter settings and test procedures in advance, reducing the need for on-the-fly adjustments during execution while maintaining the ability to make quick decisions through automated parameter selection based on actual measurement results.
Data Source
AI summary
A method for planning and executing a test of a DUT includes receiving a test description from a user via a GUI, where the test description identifies the DUT and an objective of the test; composing a prompt for querying a large language model (LLM) based on the test description, where LLM includes a trained machine learning algorithm; sending the prompt to the LLM via an API; determining, using the LLM, a test plan for executing the test to be performed in response to the prompt to achieve the objective of the test based on the test description and general testing information, where the test plan identifies a type of test, test instruments for performing the test, a test procedure using the instrument, and parameters of the DUT to be measured according to the test procedure; providing, via the GUI, the test plan to the user for testing the DUT.


