LLM Test Sequence Generation for Faster DUT Validation

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Solution Overview

Problem

Test engineers face high overhead costs in time, training, and expertise due to the need to interact with multiple disparate software systems and require specialized knowledge across various roles in developing test processes for devices under test (DUTs), leading to extended time to market.

Innovation Solution

A generative AI-based system, utilizing a large language model (LLM), generates a test sequence from documentation associated with the DUT, including operating ranges and available tests, to streamline the test process by integrating various tools and reducing the need for extensive expertise.

Engineering Contradictions & Design Principles

VSEngineering Contradiction Analysis

1Adaptability or versatility

If multiple disparate software systems are used to support test process development, then test functionality and capabilities are improved, but device complexity and overhead costs increase

Engineering Contradiction:
Improvetest functionalityVSAvoidsystem complexity
Core Design Contradiction:
Adaptability or versatilityVSDevice complexity

Solution Approach 1:

The patent combines multiple disparate software systems into a single integrated test process development platform. The system unifies test design, test execution, and result analysis functionalities that previously required separate tools, thereby reducing system complexity while maintaining comprehensive test capabilities.

Inventive Principle:
Principle #5Merging (Combining)

Solution Approach 2:

The invention creates a universal test process development system that performs multiple functions including test sequence generation, test case management, and result analysis. This multi-functional platform replaces the need for multiple specialized tools, reducing overhead costs while providing versatile test support.

Inventive Principle:
Principle #6Universality (Multi-functionality)

2Reliability

If specialized expertise across multiple roles is required for test process development, then test quality and comprehensiveness are improved, but loss of time and training costs increase

Engineering Contradiction:
Improvetest qualityVSAvoidtime to market
Core Design Contradiction:
ReliabilityVSLoss of time

Solution Approach 1:

The system enables automated test sequence generation where the test process development system itself performs tasks that previously required specialized human expertise. The automated generation of test sequences from requirements reduces dependency on highly skilled test engineers while maintaining test quality.

Inventive Principle:
Principle #25Self-service

Solution Approach 2:

The system performs preliminary test sequence generation and validation automatically before human review, preparing high-quality test cases in advance. This preliminary automated action reduces the time required for manual test design while maintaining comprehensive test coverage.

Inventive Principle:
Principle #10Preliminary action

3Reliability

If comprehensive test process development is performed manually, then test thoroughness is improved, but productivity and time to market worsen

Engineering Contradiction:
Improvetest thoroughnessVSAvoidtest development speed
Core Design Contradiction:
ReliabilityVSProductivity

Solution Approach 1:

The patent replaces manual mechanical test design processes with automated computational systems. The system automatically generates test sequences, validates test cases, and manages test execution, substituting human manual efforts with automated processes that maintain thoroughness while dramatically improving productivity.

Inventive Principle:
Principle #28Mechanics substitution (Replace mechanical system)

Solution Approach 2:

The system changes the parameters of test development by using automated algorithms to generate test sequences based on input requirements. This transformation from manual parameter specification to automated parameter generation maintains test thoroughness while accelerating development speed.

Inventive Principle:
Principle #35Parameter changes

Data Source

PatentUS20250355788A1Test Sequence Generation
Publication Date: 2025.11.20 NATIONAL INSTRUMENTS CORP
  • US20250355788A1 patent drawing
  • US20250355788A1 patent drawing
  • US20250355788A1 patent drawing

AI summary

Apparatuses, systems, and methods for test sequence generation to validate a device under test (DUT) can include generating a structured set of test sequence inputs and performing a large language model (LLM) call using the structured set of test sequence inputs. The structured set of test sequence inputs can include parameters associated with the DUT, a list of available tests associated with the DUT, instructions for an LLM to query a database to retrieve test sequence information associated with the DUT, and/or an output structure. The LLM call can be used to generate the test sequence for validating the DUT based on the generated structured set of test sequence inputs.