Load Testing Device Housing Segmentation for Relay Wiring

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Solution Overview

Problem

Existing load testing devices do not adequately consider the disposition of switches (relays) within their housing, making it difficult to efficiently test both high-voltage and low-voltage power supplies and complicating the wiring of relay and resistor groups.

Innovation Solution

A load testing device with a terminal unit connected to a test target power supply, a main relay unit, a resistance unit comprising multiple resistor groups, and a switch group, all housed in a structured manner that allows easy switching between series and parallel connections for the resistor groups, facilitating the testing of both high-voltage and low-voltage power supplies.

Engineering Contradictions & Design Principles

VSEngineering Contradiction Analysis

1Adaptability or versatility

If multiple relays are prepared to switch connection states between series and parallel for high-voltage and low-voltage testing, then the device can cope with both high-voltage and low-voltage test target power supplies, but the wiring complexity between relays and resistor groups increases

Engineering Contradiction:
Improvecapability to test high-voltage and low-voltage power suppliesVSAvoidwiring complexity of relay and resistor group
Core Design Contradiction:
Adaptability or versatilityVSDevice complexity

Solution Approach 1:

The housing is divided into multiple accommodation regions (first through fifth regions) that separately house different functional components. The resistor groups are segmented into first and second groups for each phase, with dedicated accommodation regions. This segmentation allows independent arrangement and simplifies wiring within each region while maintaining overall system versatility.

Inventive Principle:
Principle #1Segmentation

Solution Approach 2:

The patent introduces a spatial dimension solution by arranging accommodation regions in specific spatial relationships within the housing. The first, second, and third regions are positioned between the fourth and fifth regions, creating a layered spatial structure that reduces wiring complexity by bringing relays and their corresponding resistor groups into closer proximity in three-dimensional space.

Inventive Principle:
Principle #17Another dimension (Dimensionality change)

2Volume of moving object

If relays are disposed in a compact housing to accommodate all components, then the device size is reduced, but the wiring of relay and resistor group becomes difficult

Engineering Contradiction:
Improvehousing volumeVSAvoidease of wiring relay and resistor group
Core Design Contradiction:
Volume of moving objectVSEase of operation

Solution Approach 1:

The housing interior is segmented into five distinct accommodation regions, each with a specific function. This segmentation allows compact arrangement of components while maintaining organized wiring paths. Each region is optimized for its specific component type, enabling space-efficient packaging without compromising wiring accessibility.

Inventive Principle:
Principle #1Segmentation

Solution Approach 2:

Different regions of the housing are optimized for different component types and wiring requirements. The fourth region, which accommodates relays, is positioned adjacent to regions containing resistor groups, creating local clusters where wiring is most efficient. This local optimization of spatial arrangement facilitates easier wiring while maintaining overall compactness.

Inventive Principle:
Principle #3Local quality

Data Source

PatentUS12332321B2Load testing device
Publication Date: 2025.06.17 TATSUMI CORP
  • US12332321B2 patent drawing
  • US12332321B2 patent drawing
  • US12332321B2 patent drawing

AI summary

A load testing device includes a terminal unit, a main relay unit, a resistance unit, and a housing. The main relay unit and the switch group are used to switch a connection state between the first R-phase resistor group and the second R-phase resistor group between series and parallel, switch a connection state between the first S-phase resistor group and the second S-phase resistor group between series and parallel, and switch a connection state between the first T-phase resistor group and the second T-phase resistor group between series and parallel. A first accommodation region to a third accommodation region are located between a fourth accommodation region and a fifth accommodation region. The second accommodation region is located between the first accommodation region and the third accommodation region. The first accommodation region accommodates the first R-phase resistor group and the second R-phase resistor group.