High-Speed Localization Microscopy via Excitation Intensity Control

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Solution Overview

Problem

Current localization microscopy methods are limited by the need for chemical manipulation of fluorescence emitters and are not suitable for high-speed imaging, particularly in live-cell microscopy, as they require long integration times and can cause light damage.

Innovation Solution

A high-speed localization microscopy method that uses conventional dyes to induce blinking in fluorescence emitters by adjusting the intensity of excitation radiation, allowing for high-resolution imaging without chemical manipulation, where the emitters switch between a bright and dark state at a controlled blinking frequency, enabling rapid image capture and accurate localization analysis.

Engineering Contradictions & Design Principles

VSEngineering Contradiction Analysis

1Duration of action of moving object

If chemical manipulation is used to extend the dark state lifetime of fluorescence emitters, then the duration of action of the fluorescence emitter is improved, but the object-affected harmful factors increase due to chemical influence on specimens

Engineering Contradiction:
Improvedark state lifetimeVSAvoidchemical influence on specimen
Core Design Contradiction:
Duration of action of moving objectVSObject-affected harmful factors

Solution Approach 1:

The patent changes the physical parameter of excitation radiation intensity to control the blinking frequency and dark state lifetime of fluorescence emitters, replacing chemical manipulation with optical parameter adjustment. By varying the excitation intensity, the system achieves different blinking rates without introducing harmful chemicals into the specimen environment.

Inventive Principle:
Principle #35Parameter changes

2Measurement precision

If long integration times are used for localization microscopy, then the measurement precision is improved, but the productivity decreases due to slow image acquisition

Engineering Contradiction:
Improvelocalization accuracyVSAvoidimage acquisition speed
Core Design Contradiction:
Measurement precisionVSProductivity

Solution Approach 1:

The patent employs periodic blinking action of fluorescence emitters, where emitters switch between bright and dark states at controlled frequencies. This periodic behavior allows the system to capture multiple localized positions of the same emitter over time, improving localization precision through statistical accumulation while maintaining faster overall imaging speeds compared to continuous illumination methods.

Inventive Principle:
Principle #19Periodic action

3Productivity

If high excitation intensity is used to increase blinking frequency, then the productivity is improved through faster imaging, but the object-affected harmful factors increase due to photon stress on specimens

Engineering Contradiction:
Improveimaging speedVSAvoidphoton stress on specimen
Core Design Contradiction:
ProductivityVSObject-affected harmful factors

Solution Approach 1:

The patent utilizes the inherent photophysical properties of fluorescence emitters to generate their own blinking behavior under excitation. The emitters naturally transition between bright and dark states based on their photochemistry, allowing the system to achieve controlled blinking frequencies without requiring excessively high excitation intensities that would cause photodamage. The system serves itself by exploiting the emitter's intrinsic response to moderate excitation.

Inventive Principle:
Principle #25Self-service

Applied Scientific Principles

This section explains which scientific principles are used to turn an abstract innovation direction into a practical engineering solution.

Function Achieved in This Case

This approach allows for high-resolution imaging without chemical influence, reducing photon stress on specimens and enabling faster image acquisition without compromising signal-to-noise ratio, making it suitable for live-cell microscopy.

Implementation Method 1

fluorescence emitters in the specimen are excited to emit fluorescent radiation

Methodology Applied
Scientific EffectFluorescence: Fluorescence

Data Source

PatentUS10119914B2Fast high-resolution microscopy method and fast high-resolution microscope
Publication Date: 2018.11.06 CARL ZEISS MICROSCOPY GMBH
  • US10119914B2 patent drawing
  • US10119914B2 patent drawing
  • US10119914B2 patent drawing

AI summary

A fast, high-resolution localization microscopy method for a specimen containing fluorescence emitters. In a bright state, emitters emit fluorescent radiation upon excitation irradiation, and in a dark state, the fluorescence emitters do not emit fluorescent radiation upon excitation irradiation. The emitters can be brought from the bright state into the dark state by irradiation, and the dark state has a lifetime after which the emitters return to the bright state spontaneously, such that the emitters blink at a blinking frequency. The blinking specimen is imaged with a spatial resolution and detected with a camera, the intensity of the radiation is set such that emitters are isolated in the individual images in terms of the spatial resolution, and the refresh rate at which the images are produced is not lower than the blinking frequency. Locations are determined for isolated emitters in the images with an accuracy that exceeds the spatial resolution.