Locking Mechanism Distributes Reaction Forces in Electronic Device Testing
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Solution Overview
Problem
Conventional electronic device testing apparatuses face challenges in ensuring stable electrical contact and extending service life due to high pressing forces and reaction forces, which lead to stress concentration and reduced durability.
Innovation Solution
An electronic device testing apparatus with a locking mechanism that distributes reaction forces and securely engages a press head with a socket plate, using a lifting arm, press head, and pressing force generating device to maintain contact and reduce stress concentration.
Engineering Contradictions & Design Principles
Engineering Contradiction Analysis
1Reliability
If a pressing force generating device exerts a great pressing force (greater than 115 Kgf or 200 Kgf) to ensure electrical contact between the electronic device and chip socket, then electrical contact reliability is improved, but the support structure experiences severe stress concentration which reduces service life
Solution Approach 1:
The pressing force is segmented and distributed through multiple pogo pins (4500 pins) rather than concentrated on a single point. The locking mechanism further segments the force distribution by providing multiple locking points around the periphery of the press head, preventing stress concentration at any single location on the support structure.
Solution Approach 2:
The locking mechanism combines multiple functions: it provides structural support, distributes reaction forces, and maintains pressing force stability. By merging these functions into a single integrated mechanism, the system achieves reliable electrical contact while protecting the support structure from excessive stress.
2Stability of the object's composition
If the lifting arm and pressing force generating device apply continuous pressing force to maintain contact, then electrical contact stability is improved, but the support structure bears continuous heavy load which challenges its strength
Solution Approach 1:
The locking mechanism acts as an intermediary between the press head and the support structure. It absorbs and distributes the reaction forces generated during pressing, preventing these forces from being directly transmitted to the support structure. This mediator role maintains electrical contact stability while protecting the support structure from excessive loading.
Solution Approach 2:
The locking mechanism engages before the full pressing force is applied, establishing a pre-loaded stable structure. By locking the press head to the socket plate in advance, the system prepares the force transmission path to handle the upcoming pressing force without shocking the support structure.
Data Source
AI summary
An electronic device testing apparatus with a locking mechanism for locking a press head and a socket plate is provided. When an electronic device is to be tested, a lifting arm is lowered so that a contact portion is in contact with the electronic device, and a locking mechanism is actuated to detain the press head on the socket plate. A pressing force generating device exerts a pressing force onto the electronic device and the socket plate, and at least a portion of a reaction force can be directed back to the locking mechanism. The locking mechanism is adapted to detain the press head on the socket plate. When the pressing force generating device generates a predetermined pressing force to certainly establish electrical connection between the electronic device and the chip socket, the reaction force produced by the chip socket may be distributed over the locking mechanism.