Semiconductor Logic Diagnostics Across Drive Voltage And Clock Variation
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Solution Overview
Problem
Current diagnostic technologies using Built-in-Self-Test (BIST) for logic circuits in semiconductor devices are insufficient in ensuring reliability due to fluctuations in operating conditions such as drive voltage and clock frequency during normal operation.
Innovation Solution
A semiconductor device with a diagnostic circuit that performs multiple diagnostic processes under varying operating conditions, including different drive voltages and clock frequencies, to ensure the logic circuit can maintain normal operation despite fluctuations.
Engineering Contradictions & Design Principles
Engineering Contradiction Analysis
1Reliability
If a single diagnostic process is performed under fixed operating conditions, then the diagnostic process is simple and fast, but the reliability of the logic circuit cannot be ensured under varying operating conditions
Solution Approach 1:
The diagnostic process dynamically adapts to different operating conditions by automatically adjusting drive voltages and clock frequencies during diagnosis. The diagnostic circuit performs multiple diagnostic processes with varying operating parameters to comprehensively verify logic circuit reliability across all expected operational states, rather than using a fixed single-condition test.
Solution Approach 2:
The invention changes physical operating parameters (drive voltage and clock frequency) during the diagnostic process. The diagnostic circuit varies these parameters across multiple diagnostic processes to test the logic circuit under different operating conditions, ensuring that reliability is verified across the full range of expected operation rather than at a single fixed point.
2Measurement precision
If multiple diagnostic processes with varying operating conditions are performed, then the reliability and diagnostic accuracy are improved, but the diagnostic time and process complexity increase
Solution Approach 1:
The diagnostic circuit performs preliminary actions by pre-establishing a sequence of diagnostic processes with varying operating conditions before actual diagnosis begins. The test pattern generation and diagnostic framework are prepared in advance, allowing the actual diagnostic time to be minimized while still comprehensive testing across multiple operating conditions.
Solution Approach 2:
The diagnostic processes continue sequentially without unnecessary interruptions, maintaining useful diagnostic action throughout. Each diagnostic process flows directly into the next with varying operating conditions, ensuring continuous verification without idle time, thereby reducing overall diagnostic time while maintaining comprehensive coverage.
3Ease of operation
If the logic circuit operates under fixed operating conditions during diagnosis, then the diagnostic process is straightforward, but the circuit cannot be guaranteed to operate normally under all possible operating conditions
Solution Approach 1:
The diagnostic circuit is designed with multi-functionality to handle multiple operating conditions through a single integrated diagnostic system. Rather than requiring separate simple diagnostic processes for each operating condition, the universal diagnostic circuit automatically adapts to test under varying drive voltages and clock frequencies, providing comprehensive verification without complicating the user interface or operation.
Data Source
AI summary
A semiconductor device (1) includes: a logic circuit (11); and a diagnostic circuit (120), configured so as to perform a diagnostic process of diagnosing whether the logic circuit is in a state capable of normal operation based on output data of the logic circuit when a test pattern is supplied to the logic circuit. The diagnostic circuit executes multiple diagnostic processes with operating conditions of the logic circuit differing from each other.