Logic Die TSV Interface for Low-Latency Memory Stacks

Resolve Bottlenecks,
Find Innovative Solutions
Generate Solutions

Solution Overview

Problem

Existing semiconductor devices with through silicon vias (TSVs) experience latency during signal transmission and reception due to the interface structure between memory controllers and core dies, particularly in high-bandwidth memory (HBM) systems.

Innovation Solution

A semiconductor device with a logic die that includes a memory controller, interface circuit, and TSVs, which converts voltage and synchronizes signals between different voltage and clock domains using TSV macros to facilitate direct interfacing between the memory controller and core dies.

Engineering Contradictions & Design Principles

VSEngineering Contradiction Analysis

1Reliability

If an interposer is used to provide the interface between memory controller and core dies, then the interface functionality is achieved, but signal transmission latency increases

Engineering Contradiction:
Improveinterface functionalityVSAvoidsignal transmission latency
Core Design Contradiction:
ReliabilityVSLoss of time

Solution Approach 1:

The patent extracts the interface circuit functionality from a separate interposer structure and integrates it directly into the logic die. The TSV circuit blocks are positioned within the logic die's TSV region, eliminating the need for an external interposer and reducing signal transmission latency while maintaining interface functionality.

Inventive Principle:
Principle #2Taking out (Extraction)

Solution Approach 2:

The patent merges the memory controller, interface circuit, and TSV circuit blocks into a single logic die. This integration combines previously separate components (controller and interface) into one unified structure, enabling direct communication with core dies without requiring an interposer, thereby reducing latency.

Inventive Principle:
Principle #5Merging (Combining)

2Adaptability or versatility

If voltage level conversion is implemented between different voltage domains, then compatibility between memory controller and core dies is achieved, but circuit complexity increases

Engineering Contradiction:
Improvevoltage domain compatibilityVSAvoidcircuit complexity
Core Design Contradiction:
Adaptability or versatilityVSDevice complexity

Solution Approach 1:

The patent implements voltage level conversion locally at the TSV circuit blocks that are directly connected to the TSVs. Each TSV circuit block performs voltage conversion for its specific connection point, rather than requiring a centralized complex voltage conversion system. This localized approach achieves voltage domain compatibility while minimizing overall circuit complexity.

Inventive Principle:
Principle #3Local quality

3Reliability

If signal synchronization between different clock domains is implemented, then reliable communication between memory controller and core dies is achieved, but processing complexity increases

Engineering Contradiction:
Improvecommunication reliabilityVSAvoidprocessing complexity
Core Design Contradiction:
ReliabilityVSDevice complexity

Solution Approach 1:

The patent implements signal synchronization locally at each TSV circuit block, which handles synchronization for its specific TSV connection. This distributed local synchronization approach achieves reliable communication between different clock domains without requiring a complex centralized synchronization system, thereby reducing processing complexity.

Inventive Principle:
Principle #3Local quality

4Speed

If direct interfacing between memory controller and core dies is implemented, then signal transmission speed is improved, but design flexibility is reduced

Engineering Contradiction:
Improvesignal transmission speedVSAvoiddesign flexibility
Core Design Contradiction:
SpeedVSAdaptability or versatility

Solution Approach 1:

The patent designs the logic die with a standardized TSV region and TSV circuit blocks that can accommodate multiple core dies with different voltage domains and clock domains. This universal interface design enables direct high-speed interfacing while maintaining design flexibility to support various configurations of memory devices.

Inventive Principle:
Principle #6Universality (Multi-functionality)

Data Source

PatentEP4607515A1Semiconductor device including logic die
Publication Date: 2025.08.27 SAMSUNG ELECTRONICS CO LTD
  • EP4607515A1 patent drawingFigure 1
  • EP4607515A1 patent drawingFigure 2
  • EP4607515A1 patent drawingFigure 3A

AI summary

Provided are a logic die for supporting direct interfacing between a memory die and a memory controller via a through silicon via (TSV) and a semiconductor device including the logic die. The semiconductor device includes a logic die including a memory controller, an interface circuit, and a plurality of TSVs arranged in a TSV region. A plurality of memory dies stacked vertically on the logic die, and connected to the plurality of TSVs. The memory controller operates in a first voltage domain, and the plurality of memory dies operate in a second voltage domain. The interface circuit includes a plurality of TSV circuit blocks connected to the plurality of TSVs. Each TSV circuit block is configured to convert a voltage level of a signal, transmitted via a corresponding TSV, between a first voltage level in the first voltage domain and a second voltage level in the second voltage domain.