Automatic Logical Path Segment Detection in Measurement Populations

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Solution Overview

Problem

Conventional test and measurement instruments, such as oscilloscopes, present measurements as black-box results, making it difficult for users to diagnose errors or abnormal results, as they typically perform only one measurement on a waveform and lack tools to analyze the source of unexpected measurements.

Innovation Solution

The system generates measurement populations from waveform data records, automatically detecting logical path segments by overlaying multiple measurements and using machine-learning or pattern recognition to separate these segments, allowing for visual representation and histogram generation to help users understand measurement distributions and debug devices.

Engineering Contradictions & Design Principles

VSEngineering Contradiction Analysis

1Productivity

If measurements are presented as black-box results, then the measurement process is simple and fast, but users cannot easily review measurements to determine potential causes of errors or abnormal results

Engineering Contradiction:

Improvemeasurement speedVSAvoidmeasurement source information

Core Design Contradiction:

ProductivityVSLoss of information

Solution Approach 1:

The patent segments the measurement population into multiple logical path segments based on waveform characteristics and measurement values. Each segment represents a distinct group of waveforms with similar measurement outcomes, allowing users to trace abnormal measurements back to specific waveform patterns and logical paths without overwhelming detail

Inventive Principle:

Principle #1Segmentation

Solution Approach 2:

The patent introduces logical path segments as an intermediary between raw waveform data and final measurement results. These segments act as a bridge that preserves measurement source information while maintaining measurement efficiency, enabling users to understand the relationship between waveforms and measurements without presenting all raw data

Inventive Principle:

Principle #24Intermediary (Mediator)

2Device complexity

If only one measurement is performed on a waveform, then the measurement process is simple, but users cannot see the source of the measurement or analyze measurement distributions

Engineering Contradiction:

Improvemeasurement process complexityVSAvoidmeasurement population data

Core Design Contradiction:

Device complexityVSLoss of information

Solution Approach 1:

The patent divides the single measurement into multiple logical path segments that represent different waveform occurrences and measurement outcomes. Each segment contains information about waveform characteristics, measurement values, and occurrence frequencies, enabling comprehensive analysis while maintaining manageable complexity through organized segmentation

Inventive Principle:

Principle #1Segmentation

Solution Approach 2:

The patent adds a new dimension to measurement analysis by organizing measurements into logical path segments with multiple attributes (waveform characteristics, measurement values, occurrence frequencies). This dimensional expansion transforms a single measurement into a multi-dimensional measurement population that can be analyzed comprehensively without overwhelming complexity

Inventive Principle:

Principle #17Another dimension (Dimensionality change)

3Reliability

If measurements are made on all occurrences of a waveform, then complete measurement coverage is achieved, but it becomes more difficult to figure out why a measurement is unexpected

Engineering Contradiction:

Improvemeasurement coverageVSAvoidanomaly detection difficulty

Core Design Contradiction:

ReliabilityVSDifficulty of detecting and measuring

Solution Approach 1:

The patent segments the complete measurement population into logical path segments grouped by waveform characteristics and measurement outcomes. This segmentation reduces anomaly detection difficulty by organizing measurements into manageable groups, allowing users to identify unexpected measurements within specific logical paths rather than searching through all waveform occurrences

Inventive Principle:

Principle #1Segmentation

Solution Approach 2:

The patent applies local quality by providing different levels of measurement detail in different contexts. For common measurements, a summary view is provided, while for unexpected or abnormal measurements, detailed logical path information is automatically highlighted, making anomaly detection easier without sacrificing measurement coverage

Inventive Principle:

Principle #3Local quality

Data Source

PatentUS11237190B2Automatic detection of logical path segments in a measurement population

Publication Date: 2022.02.01 TEKTRONIX INC

AI summary

A test and measurement instrument, including a memory configured to store a waveform data record; one or more processors, and a display. The one or more processors are configured to receive the waveform data record, determine a measurement value and location for a plurality of occurrences of a measurement event in the waveform data record, detect one or more logical path segments in the plurality of occurrences, and generating a visual representation of each measurement value and overlaying each of the visual representations of each measurement value. The visual representations of each measurement value and/or the one or more logical path segments may be displayed on the display.