Low Latency Buffer for Data Storage Device Testing
Find Innovative SolutionsGenerate Solutions
Solution Overview
Problem
Existing methods for testing data storage devices incur delays due to software layer priorities and varying processing loads, leading to inaccurate and non-repeatable results in evaluating device capabilities.
Innovation Solution
The method involves generating sequential commands for data storage devices and storing command summary data in a low latency buffer, which is then migrated to a persistent storage device, allowing for minimal latency and accurate testing of device capabilities.
Engineering Contradictions & Design Principles
Engineering Contradiction Analysis
1Reliability
If commands are sent through multiple software layers (OS, platform, application, device driver), then system stability and resource management are improved, but command transmission latency increases and testing accuracy deteriorates
Solution Approach 1:
The patent extracts the command transmission path from the multi-layer software stack by implementing a dedicated low-latency buffer that bypasses the OS, platform, and application layers. Test commands are generated and transmitted directly through this specialized buffer to the device under test, eliminating the delays caused by priority-based scheduling in the general software stack while maintaining system stability for other operations.
Solution Approach 2:
The low-latency buffer acts as an intermediary component between the test command generator and the device under test. This mediator structure allows test commands to be transmitted with minimal latency while the rest of the system continues to operate through its normal multi-layer software architecture, thus resolving the contradiction between system stability and testing speed.
2Ease of operation
If processor executes higher priority processes before sending test commands, then system responsiveness is improved, but test result repeatability deteriorates
Solution Approach 1:
The patent segments the command transmission function from the general processor task scheduling by creating a dedicated low-latency buffer specifically for test commands. This segmentation ensures that test command transmission is handled separately from other system processes, guaranteeing repeatable test results while allowing the processor to continue executing higher-priority system processes without interference.
3Productivity
If test commands wait for processor availability, then processor utilization is optimized, but test accuracy deteriorates
Solution Approach 1:
The patent extracts test command transmission from the general processor scheduling system by implementing a dedicated low-latency buffer. This allows test commands to be transmitted immediately when generated, without waiting for processor availability or being subject to priority-based scheduling, thereby maintaining both high processor utilization for system tasks and high test accuracy through minimal latency.
Data Source
AI summary
The present disclosure relates to methods and apparatus for testing the true capabilities of devices connected to a computer. Methods consistent with the present disclosure may include generating test commands to send to a data storage device under test while storing information related to the commands sent to the data storage device in a low latency buffer. The low latency buffer may temporarily store command related data while data from a plurality of commands are organized and persistently stored in memory of a persistent data storage device. The low latency buffer may include or be comprised of high speed random access memory and the persistent data storage device may be a solid state drive or hard disk drive. Preferably, the persistent data storage device will store command test sequences that span long periods of time of hours or days.