Low-Oxygen Carbon Electrode Coating for Long-Term Activity Retention

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Solution Overview

Problem

Existing electrode production methods limit the durability of electrodes, particularly in maintaining performance over long periods of storage.

Innovation Solution

The electrode comprises a substrate film, a metal underlying layer, and a conductive carbon layer, with a specific oxygen-to-carbon ratio measured using X-ray photoelectron spectroscopy, and is produced using a method that includes sputtering under low water partial pressure.

Engineering Contradictions & Design Principles

VSEngineering Contradiction Analysis

1Reliability

If conventional sputtering method is used to dispose conductive carbon layer on substrate, then electrode can be produced, but the electrode activity deteriorates after long-term storage

Engineering Contradiction:
Improveelectrode activity durabilityVSAvoidstorage period
Core Design Contradiction:
ReliabilityVSDuration of action of stationary object

Solution Approach 1:

The patent applies parameter changes by controlling the water partial pressure during sputtering to 1.40×10^-4 Pa or less, and by optimizing the oxygen-to-carbon ratio to 0.01 or less at 4.5 nm depth. These parameter optimizations prevent excessive oxygen incorporation in the carbon layer, thereby maintaining electrode activity durability after long-term storage.

Inventive Principle:
Principle #35Parameter changes

Solution Approach 2:

The patent creates an inert environment by performing sputtering under ultra-low water partial pressure conditions (1.40×10^-4 Pa or less). This inert atmosphere prevents water and oxygen from contaminating the carbon layer during deposition, ensuring the layer maintains its electrochemical activity over extended storage periods.

Inventive Principle:
Principle #39Inert atmosphere (Inert environment)

2Manufacturing precision

If sputtering is performed under normal atmosphere, then conductive carbon layer can be deposited, but oxygen content increases reducing electrode performance

Engineering Contradiction:
Improveoxygen-to-carbon ratio controlVSAvoidoxygen contamination
Core Design Contradiction:
Manufacturing precisionVSObject-affected harmful factors

Solution Approach 1:

The patent performs sputtering in an inert atmosphere with water partial pressure controlled to 1.40×10^-4 Pa or less. This prevents oxygen and water vapor from contaminating the carbon layer during deposition, achieving precise control of the oxygen-to-carbon ratio at 0.01 or less.

Inventive Principle:
Principle #39Inert atmosphere (Inert environment)

Solution Approach 2:

The patent replaces conventional atmospheric deposition with vacuum-based sputtering under controlled low water partial pressure. This substitution allows precise control of the chemical composition by eliminating atmospheric oxygen interference during the deposition process.

Inventive Principle:
Principle #28Mechanics substitution (Replace mechanical system)

Applied Scientific Principles

This section explains which scientific principles are used to turn an abstract innovation direction into a practical engineering solution.

Function Achieved in This Case

This configuration enhances the durability of electrode activity, reducing performance degradation even after long-term storage, and maintains excellent activity on ferricyan.

Implementation Method 1

a third step of carrying out sputtering under an atmosphere under which a partial pressure of water is 1.40×10−4 Pa or less to dispose the conductive carbon layer on a one-side surface of the metal underlying layer

Methodology Applied
Scientific EffectSputtering: Sputtering

Implementation Method 2

the ratio (O/C) of oxygen to carbon is measured using X-ray photoelectron spectroscopy

Methodology Applied
Scientific EffectX-ray photoelectron spectroscopy: Photoelectric Effect

Data Source

PatentUS12344928B2Electrode and method of producing the electrode
Publication Date: 2025.07.01 NITTO DENKO CORP
  • US12344928B2 patent drawing
  • US12344928B2 patent drawing

AI summary

An electrode includes a substrate film, a metal underlying layer, and a conductive carbon layer. A ratio (O/C) of oxygen to carbon at a place 4.5 nm away from a one-side surface of the conductive carbon layer toward the other side in the thickness direction is less than 0.01 where the ratio (O/C) of oxygen to carbon is measured using X-ray photoelectron spectroscopy.