Low-Pass Filter Circuit for Time Jitter Injection
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Solution Overview
Problem
High-speed testing of electronic devices is costly due to expensive high-speed testing instruments, and existing methods for injecting time jitter are unaffordable, making it challenging to efficiently test signal reception capabilities without incurring high fabrication costs.
Innovation Solution
A testing circuit with a low-pass filter and an AC common mode offset circuit is used to generate a testing signal with time jitter, simulating frequency and time domain responses to match the specifications of the under-test device, allowing for cost-effective testing by coupling the output signal of the under-test device through a low-pass filter and injecting periodic jitter.
Engineering Contradictions & Design Principles
Engineering Contradiction Analysis
1Measurement precision
If high-speed testing instruments are used to test signal reception capability, then testing accuracy is improved, but fabrication cost increases
Solution Approach 1:
The patent uses a low-pass filter to generate a testing signal that copies the essential characteristics of a high-speed testing signal, including time jitter properties. Instead of using an expensive high-speed testing instrument, the invention creates a simplified copy that replicates the necessary test conditions through filtering the output signal, thereby achieving accurate testing at lower cost
Solution Approach 2:
The invention replaces expensive, complex high-speed testing instruments with a simple, inexpensive low-pass filter circuit. This cheap alternative performs the essential function of generating time-jittered testing signals without requiring high-speed processing capabilities, making the testing process affordable and accessible
2Adaptability or versatility
If additional high-speed testing equipment is used to inject time jitter, then testing capability is improved, but fabrication cost increases
Solution Approach 1:
The low-pass filter serves multiple functions simultaneously: it generates the testing signal, introduces time jitter, and shapes the frequency spectrum. This single component performs what would traditionally require multiple specialized high-speed testing equipment pieces, providing universal testing capability at reduced cost
Solution Approach 2:
The invention changes the key parameter of the testing signal from high-speed to low-speed by passing it through a low-pass filter. This parameter transformation maintains the essential time jitter characteristics needed for testing while reducing the speed requirement, thereby eliminating the need for expensive high-speed equipment
Applied Scientific Principles
This section explains which scientific principles are used to turn an abstract innovation direction into a practical engineering solution.
Function Achieved in This Case
This approach reduces the fabrication and testing costs by enabling efficient signal reception capability testing of electronic devices while ensuring the testing signal's frequency and time domain responses align with the device specifications, thereby verifying the device's performance without the need for high-speed processing circuits.
Implementation Method 1
a low-pass filter coupled between the input and the output for generating the testing signal
Data Source
AI summary
A testing method includes selecting a low-pass filter by simulation, generating testing signals with the low-pass filter receiving output signals of an under-test circuit, and outputting the testing signals to an input of the under-test circuit for predetermined measurements. A testing circuit and testing method achieve the same jitter injection as conventional high-speed testing instruments, but save testing cost.