Luminance-Based Coating Inspection for Solder Paste Mounting

The patent creates a virtual reference image through image synthesis rather than relying on physical sample measurements. The synthesis unit generates reference images by combining luminance information from multiple regions, eliminating the need to physically measure and compare against actual sample components under varying inspection conditions.

The patent introduces a luminance distribution synthesis unit as an intermediary that processes raw luminance data from different regions. This synthesis unit creates a standardized reference that mediates between the varying inspection conditions and the final coating assessment, providing consistent comparison criteria without requiring physical sample recalibration.

The patent transforms the inspection approach by changing from direct physical sample comparison to synthesized reference image comparison. The synthesis unit adjusts and combines luminance parameters from different regions to create a standardized reference that is invariant to individual device differences and inspection condition variations, thereby improving reliability and adaptability.

Instead of using physical samples that vary with individual differences, the patent creates virtual reference copies through image synthesis. This virtual reference system eliminates the problem of physical sample variability while maintaining the ability to accurately assess coating states across different devices and inspection conditions.

The patent merges the reference creation and coating assessment functions into a single integrated system. The luminance distribution synthesis unit combines information from multiple regions to create references, and the same system uses these references for assessment, eliminating the need for separate physical sample measurement processes and reducing overall system complexity.

The patent replaces complex physical sample handling and comparison processes with a virtual reference copying system. The synthesis unit creates digital reference copies that can be stored and reused, eliminating the need for repeated physical sample measurements and reducing both device complexity and inspection time while maintaining assessment accuracy.