Machine Program Analysis for Automatic Defect Traceability

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Solution Overview

Problem

Existing manufacturing systems face challenges in tracing the origins of defects in components back to the upstream machines and programs due to incomplete or labor-intensive manual creation of digital threads, which are often error-prone and inefficient.

Innovation Solution

A method and system for machine program analysis that determines relationships between programs using low-level machine data, such as barcode scans, to automatically reconstruct the series of programs used in manufacturing components, leveraging distributed systems and algorithms like HyperLogLog for efficient processing.

Engineering Contradictions & Design Principles

VSEngineering Contradiction Analysis

1Reliability

If manual creation of digital threads is used to trace defect origins, then defect tracing capability is achieved, but labor intensity and error rate increase significantly

Engineering Contradiction:
Improvedefect tracing accuracyVSAvoidmanual work intensity
Core Design Contradiction:
ReliabilityVSEase of operation

Solution Approach 1:

The system enables automatic self-tracing of defect origins by having machines and programs automatically report their own execution data and relationships. The digital thread constructs itself through automated data collection from barcode scans, machine logs, and program execution records, eliminating the need for manual defect tracing operations.

Inventive Principle:
Principle #25Self-service

Solution Approach 2:

The patent replaces manual mechanical processes of defect tracing with automated computational systems. Instead of manually following the production history, the system uses algorithms to automatically analyze machine data, program relationships, and barcode information to trace defects back to their sources.

Inventive Principle:
Principle #28Mechanics substitution (Replace mechanical system)

2Loss of information

If complete digital thread documentation is implemented, then defect origin tracing is enabled, but system complexity and data processing requirements increase

Engineering Contradiction:
Improvemanufacturing process information completenessVSAvoiddata processing system complexity
Core Design Contradiction:
Loss of informationVSDevice complexity

Solution Approach 1:

The system extracts only the essential data elements needed for defect tracing from the complete manufacturing process. Instead of processing all manufacturing data, it selectively captures and processes specific information such as program execution records, barcode scan data, and machine state information that are directly relevant to defect origin tracing.

Inventive Principle:
Principle #2Taking out (Extraction)

Solution Approach 2:

The patent segments the manufacturing data into discrete, manageable units associated with specific programs and machines. Each program execution is broken down into individual data points (barcode scans, machine operations) that can be independently processed and analyzed, reducing the complexity of handling complete digital threads.

Inventive Principle:
Principle #1Segmentation

3Productivity

If automated program analysis is implemented, then processing speed increases, but computational resource requirements increase

Engineering Contradiction:
Improvedefect analysis speedVSAvoidcomputational processing energy
Core Design Contradiction:
ProductivityVSUse of energy by moving object

Solution Approach 1:

The system performs partial analysis by focusing computational resources only on programs and machines relevant to the defect being investigated. Instead of analyzing all manufacturing data, it selectively processes data from specific program sessions and machine operations that have potential connection to the defect, reducing overall computational energy requirements.

Inventive Principle:
Principle #16Partial or excessive action

Data Source

PatentUS20250216838A1System and method for machine program analysis
Publication Date: 2025.07.03 ARCH SYSTEMS INC
  • US20250216838A1 patent drawing
  • US20250216838A1 patent drawing
  • US20250216838A1 patent drawing

AI summary

A method for machine program analysis, preferably including determining data for a set of programs and determining relationships between the set of programs, and optionally including determining an analysis based on the program relationships, acting based on analyses, and/or operating manufacturing system machines. A system for machine program analysis, preferably including one or more computing systems, and optionally including one or more manufacturing systems.