Machine Tool Image Mesh Overlap for Precise Chip Detection
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Solution Overview
Problem
Accurate identification of chip accumulation positions and flaw locations within machine tools is challenging, leading to difficulties in continuous machining.
Innovation Solution
An information processing device that generates mesh images from imaged data and uses overlapping mesh regions to enhance detection accuracy by identifying detection targets in both first and second mesh regions, allowing for precise positioning and liquid discharge to remove chips and flaws.
Engineering Contradictions & Design Principles
Engineering Contradiction Analysis
1Measurement precision
If a single mesh region is used for detection, then the detection process is simple, but the detection accuracy of chip accumulation position and flaw position is insufficient
Solution Approach 1:
The image data is divided into multiple mesh regions (first mesh regions and second mesh regions) that partially overlap with each other. By segmenting the detection area into multiple overlapping regions, the system achieves more accurate detection of chip accumulation positions and flaw positions compared to using a single mesh region, while maintaining a manageable detection process through systematic comparison of results across regions.
2Area of stationary object
If multiple non-overlapping mesh regions are used, then the coverage area increases, but detection accuracy decreases due to boundary gaps between regions
Solution Approach 1:
The detection area is segmented into multiple mesh regions that are arranged to partially overlap with each other. This segmentation strategy allows the system to cover a larger total area while eliminating detection gaps that would occur with non-overlapping regions, as objects spanning region boundaries can be detected in the overlapping areas.
Solution Approach 2:
The patent introduces the dimension of spatial overlap between mesh regions. By allowing mesh regions to overlap in space rather than being strictly adjacent, the system simultaneously achieves both wide coverage and high detection accuracy, resolving the trade-off between area coverage and detection precision.
Data Source
AI summary
Disclosed is an information processing device (10) configured to identify a position of a detection target from image data imaged by an imaging unit configured to image an interior of a machine tool including the imaging unit, the information processing device including: an image generation unit (102) configured to generate a mesh image obtained by partitioning at least a portion of the image data into a plurality of mesh regions; and an identification unit (103) configured to identify the position of the detection target for a first mesh region of the mesh image, wherein the identification unit is configured to identify the position using the first mesh region, and a second mesh region shifted from the first mesh region by a predetermined amount and partially overlapping with the first mesh region.