Macro Inspection Illumination Landscape for Large Specimens
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Solution Overview
Problem
Microscopic examination is inadequate for specimens with large surface areas or features distributed across extensive regions, as it requires capturing multiple images of discrete portions and is limited in illumination types and variability.
Innovation Solution
A macro inspection apparatus with a stage, imaging device, and moveable light platform, controlled by a module that adjusts illumination based on image data to provide variable illumination landscapes, including brightfield, darkfield, and oblique illumination, enabling comprehensive specimen inspection in a single field of view.
Engineering Contradictions & Design Principles
Engineering Contradiction Analysis
1Area of stationary object
If microscopic examination is used to inspect large specimens, then illumination can be provided, but the field of view is limited and multiple images are required to capture the entire specimen
Solution Approach 1:
The illumination system is segmented into multiple independent light sources arranged in different configurations (annular, linear, point sources) that can be selectively activated. This segmentation allows the system to provide various illumination modes (brightfield, darkfield, oblique) within a single macroscopic field of view, eliminating the need for multiple microscope images while maintaining inspection efficiency
Solution Approach 2:
The macro inspection apparatus provides universal illumination capabilities by integrating multiple light source types and configurations into a single system. The moveable light platform can position different illumination sources (annular, linear, point) to provide brightfield, darkfield, and oblique illumination modes, allowing comprehensive specimen inspection in one field of view without requiring multiple specialized devices
2Adaptability or versatility
If multiple illumination modes are provided, then feature detection capability is improved, but device complexity increases
Solution Approach 1:
The illumination system employs a moveable light platform that can dynamically reposition different light sources (annular, linear, point sources) to various positions around the specimen. This dynamic positioning allows the system to switch between multiple illumination modes (brightfield, darkfield, oblique) without requiring complex fixed optical paths, thereby providing versatility while managing system complexity through motion control
Solution Approach 2:
The system provides different illumination modes by changing the spatial parameters (position, angle, distance) of light sources relative to the specimen rather than requiring fundamentally different optical systems. By varying parameters such as light source position and orientation, the system achieves multiple illumination modes (brightfield, darkfield, oblique) with a relatively simple configurable platform
Applied Scientific Principles
This section explains which scientific principles are used to turn an abstract innovation direction into a practical engineering solution.
Function Achieved in This Case
Enables efficient detection of features on large specimens by providing customizable illumination, improving inspection accuracy and reducing the need for multiple image captures, thus enhancing the examination of large specimens.
Implementation Method 1
a plurality of lights disposed on a moveable platform
Implementation Method 2
an imaging device having a field of view encompassing at least a portion of the stage to view light reflected by a specimen retained on the stage
Data Source
Figure 1A
Figure 1B
Figure 1C
AI summary
The disclosed technology relates to an inspection apparatus that includes a stage configured to retain a specimen for inspection, an imaging device having a field of view encompassing at least a portion of the stage to view a specimen retained on the stage, a lens having a view encompassing the specimen retained on the stage, and a plurality of lights disposed on a moveable platform. The inspection apparatus can further include a control module configured to control a position of the stage, an elevation of the moveable platform, and a focus of the lens. In some implementations, the inspection apparatus includes an image processing system configured for receiving image data from the imaging device, analyzing the image data to determine a specimen classification, and automatically selecting an illumination profile based on the specimen classification. Methods and machine-readable media are also contemplated.