Magnetic Field Sensor Reference Surface Alignment

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Solution Overview

Problem

Existing magnetic field measuring apparatuses face challenges in accurately measuring magnetic fields due to difficulties in positioning cells to receive probe light from specific directions, especially in multichannel systems, leading to increased noise from external magnetic fields.

Innovation Solution

A magnetic field measuring apparatus with a gradio-type configuration, where linearly-polarized light is entered into cells through optical devices on reference surfaces, with the orientation of reflected light axes adjusted to be parallel, allowing for accurate measurement by eliminating external magnetic field noise.

Engineering Contradictions & Design Principles

VSEngineering Contradiction Analysis

1Measurement precision

If the first measurement position and the second measurement position are provided in separate cells, then the magnetic field measurement can be performed using separate cells, but it requires that the probe light is accurately entered into the individual cells from the determined directions, increasing the difficulty of position adjustment

Engineering Contradiction:
Improvemagnetic field measurement accuracyVSAvoidposition adjustment difficulty
Core Design Contradiction:
Measurement precisionVSEase of manufacture

Solution Approach 1:

The patent introduces reference surfaces and adjusts the position of the second reference surface with respect to the first reference surface in a dimensional space, allowing the optical axes to be aligned in the same direction without requiring complex angular adjustments of individual cells. This transforms the alignment problem from angular adjustment to positional adjustment along a reference surface.

Inventive Principle:
Principle #17Another dimension (Dimensionality change)

2Adaptability or versatility

If pluralities of cells are provided in the first measurement position and the second measurement position for multichannel system, then the magnetic field measuring capability is enhanced, but the difficulty in position adjustment of the pluralities of cells with respect to the incident direction of the probe light is further increased

Engineering Contradiction:
Improvemultichannel measurement capabilityVSAvoidposition adjustment complexity
Core Design Contradiction:
Adaptability or versatilityVSDevice complexity

Solution Approach 1:

The patent applies the reference surface concept uniformly across all cells in the multichannel system. By providing reference surfaces for each cell and adjusting their positions relative to each other, the same alignment method can be applied to any number of cells, making the system scalable without increasing adjustment complexity proportionally.

Inventive Principle:
Principle #6Universality (Multi-functionality)

Solution Approach 2:

The patent uses reference surfaces to define a common alignment dimension for all cells. Instead of adjusting each cell's angular orientation independently, the cells are positioned relative to their reference surfaces, which are then aligned in the same direction. This reduces the adjustment degrees of freedom from angular to translational.

Inventive Principle:
Principle #17Another dimension (Dimensionality change)

3Device complexity

If the traveling direction of the probe light is reversed and entered into the second measurement position, then it is not necessary to provide a plurality of photodetectors, but it is technically difficult to enter the probe light into the first measurement position and the second measurement position from the respective determined directions

Engineering Contradiction:
Improvephotodetector quantityVSAvoidlight entry alignment difficulty
Core Design Contradiction:
Device complexityVSEase of manufacture

Solution Approach 1:

The patent introduces reference surfaces that provide a common alignment framework for entering light into cells from different directions. By adjusting the position of reference surfaces, the system enables light to be entered into the first and second measurement positions from determined directions while maintaining optical axis alignment, making the light reversal technique practically feasible.

Inventive Principle:
Principle #17Another dimension (Dimensionality change)

Applied Scientific Principles

This section explains which scientific principles are used to turn an abstract innovation direction into a practical engineering solution.

Function Achieved in This Case

The apparatus effectively measures magnetic fields by ensuring the optical axes of light entering cells are aligned, reducing external noise and improving the placement flexibility of magnetic field sources, thereby enhancing measurement accuracy.

Implementation Method 1

a first optical device placed on a first reference surface and entering the linearly-polarized light into the first cell, and a second optical device placed on a second reference surface and entering the linearly-polarized light into the second cell, wherein a position of the second reference surface with respect to the first reference surface is adjusted so that an orientation of an optical axis of a first reflected light of light relating to the first reference surface and an orientation of an optical axis of a second reflected light of light relating to the second reference surface in parallel to that light may be the same direction

Methodology Applied
Scientific EffectLight reflection: Reflection

Implementation Method 2

a highly sensitive atomic magnetic sensor using atomic spin in an alkali metal gas or rare gas is proposed

Methodology Applied
Scientific EffectZeeman effect: Zeeman Effect

Implementation Method 3

directly measuring a difference in magnetic field intensity between the first measurement position and the second measurement position as a difference in polarization rotation angle of the probe light

Methodology Applied
Scientific EffectFaraday effect: Faraday Effect

Data Source

PatentUS10036786B2Magnetic field measuring apparatus and manufacturing method of magnetic field measuring apparatus
Publication Date: 2018.07.31 SEIKO EPSON CORP
  • US10036786B2 patent drawing
  • US10036786B2 patent drawing
  • US10036786B2 patent drawing

AI summary

A magnetic field measuring apparatus includes a first cell and a second cell in which alkali metal atoms are respectively enclosed, a light guide that enters laser light into the first cell and the second cell, and a position adjustment mechanism, and a position of a second reference surface with respect to a first reference surface is adjusted and orientations of optical axes of a beam light relating to the first reference surface and a beam light relating to the second reference surface are the same direction.