Two-Element Magnetic Memory Cell Reliability

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Solution Overview

Problem

Magnetic memory cells with single memory bits are prone to failure due to incorrect setting of reference elements or resistance changes over time, leading to improper data storage.

Innovation Solution

A magnetic memory cell comprising two magnetoresistive memory bits with a comparator to determine logical states based on equivalent resistance values, allowing for shared comparative logic among multiple cells, and using applied magnetic fields to change resistance values for writing.

Engineering Contradictions & Design Principles

VSEngineering Contradiction Analysis

1Reliability

If single memory bit magnetic memory cells are used, then device complexity is reduced, but reliability deteriorates due to incorrect reference element setting or resistance changes over time

Engineering Contradiction:
Improvedata storage reliabilityVSAvoidmemory cell structure
Core Design Contradiction:
ReliabilityVSDevice complexity

Solution Approach 1:

The patent merges two memory bits into a single memory cell, where the first and second memory bits work together to store one logical state. This combination allows the cell to compare resistance values between the two bits, making the storage reliable even if one bit's resistance changes over time or during manufacturing, thus resolving the reliability issue without requiring complex external reference elements.

Inventive Principle:
Principle #5Merging (Combining)

Solution Approach 2:

The two memory bits in the cell serve multiple functions: they act as both storage elements and as mutual reference elements for comparison. Each bit can be used to determine the logical state by comparing its resistance with the other bit, eliminating the need for separate, precision-critical reference elements and reducing manufacturing complexity while improving reliability.

Inventive Principle:
Principle #6Universality (Multi-functionality)

2Measurement precision

If reference elements are used for determining logical states, then measurement precision is improved, but manufacturing precision requirements increase due to incorrect setting during manufacturing

Engineering Contradiction:
Improvelogical state determinationVSAvoidreference element setting
Core Design Contradiction:
Measurement precisionVSManufacturing precision

Solution Approach 1:

The memory bits serve themselves as reference elements. Instead of requiring externally manufactured and precisely set reference elements, each memory bit compares its resistance with another memory bit in the same cell. This self-referencing mechanism eliminates the need for high-precision manufacturing of separate reference elements, as the bits automatically provide their own reference for logical state determination.

Inventive Principle:
Principle #25Self-service

3Reliability

If resistance changes over time are accounted for, then reliability is improved, but device complexity increases due to additional comparison logic

Engineering Contradiction:
Improvelong-term data storageVSAvoidcomparative logic structure
Core Design Contradiction:
ReliabilityVSDevice complexity

Solution Approach 1:

The same two memory bits used for storage also serve as the reference elements for comparison. When determining the logical state, the resistance of one bit is compared with the other bit in the pair. This dual-use approach allows the cell to compensate for resistance drift over time without adding separate reference elements or complex comparison circuits, as the storage bits themselves perform the reference function.

Inventive Principle:
Principle #6Universality (Multi-functionality)

Applied Scientific Principles

This section explains which scientific principles are used to turn an abstract innovation direction into a practical engineering solution.

Function Achieved in This Case

Ensures reliable data storage by accurately interpreting logical states through equivalent resistance comparisons and adaptable resistance changes, reducing errors caused by inherent variations and manufacturing inaccuracies.

Implementation Method 1

Two magnetoresistive memory bits are provided. The bits may be magnetic tunneling junction devices (MTJs). An applied magnetic field may be used to change a resistance value of the first bit and/or the second bit

Methodology Applied
Scientific EffectMagnetoresistance: Magnetoresistance

Implementation Method 2

A comparator may be used to determine a logical state of the memory cell. The equivalent resistance value may include a range of resistances

Methodology Applied
Scientific EffectElectrical Resistance: Electrical Resistance

Data Source

PatentUS7474569B2Two-element magnetic memory cell
Publication Date: 2009.01.06 HONEYWELL INTERNATIONAL INC
  • US7474569B2 patent drawing
  • US7474569B2 patent drawing
  • US7474569B2 patent drawing

AI summary

A magnetic memory cell that includes at least two magnetoresistive memory bits is presented. The memory cell is capable of storing at least two logical states. The first logical state occurs when the bits share the same orientation, such as a parallel orientation or an antiparallel orientation. The second logical state occurs when the bits have opposite orientations. In the second logical state one of the bits has a parallel orientation and the other bit has an antiparallel orientation.