Magnetic Memory Devices Using Oxide Multiferroic Exchange Coupling

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Solution Overview

Problem

Magnetic memory devices face challenges in achieving high stability and improved switching properties, which are crucial for mass production and meeting demands for faster operating speeds and lower power consumption.

Innovation Solution

A magnetic memory device with a magnetic tunnel junction (MTJ) is designed, incorporating a variable resistance device structure that includes a free layer, a pinned layer, a tunnel barrier, an assistant layer, and an exchange coupling layer with ferroelectric and antiferromagnetic properties. The exchange coupling layer, potentially made of BiFeO3, has electric polarization and magnetic moments that can be altered by applied voltages, enabling efficient data storage and switching.

Engineering Contradictions & Design Principles

VSEngineering Contradiction Analysis

1Reliability

If conventional magnetic tunnel junction structure is used, then basic data storage function is achieved, but stability and switching properties are insufficient for mass production

Engineering Contradiction:
Improvedata stabilityVSAvoidmanufacturing readiness
Core Design Contradiction:
ReliabilityVSEase of manufacture

Solution Approach 1:

The patent employs oxide multiferroic materials (simultaneously exhibiting ferroelectric and antiferromagnetic properties) in the exchange coupling layer to create a composite structure that provides both high data stability through strong exchange coupling and improved switching properties through voltage-controlled magnetization, resolving the contradiction between reliability and manufacturability

Inventive Principle:
Principle #40Composite materials

Solution Approach 2:

The patent utilizes voltage-induced changes in the exchange coupling layer's magnetization orientation and electric polarization to control the magnetic tunnel junction's resistance state, enabling stable data storage with improved switching characteristics that enhance both reliability and device performance

Inventive Principle:
Principle #35Parameter changes

2Speed

If conventional MTJ structure is used, then data storage is possible, but switching current is high and operating speed is limited

Engineering Contradiction:
Improveoperating speedVSAvoidswitching current
Core Design Contradiction:
SpeedVSUse of energy by moving object

Solution Approach 1:

The patent replaces conventional current-driven magnetization switching mechanisms with voltage-driven switching through the oxide multiferroic exchange coupling layer,利用电场控制磁化方向,从而降低切换电流并提高操作速度

Inventive Principle:
Principle #28Mechanics substitution (Replace mechanical system)

Solution Approach 2:

The patent changes the switching mechanism from current-based to voltage-based by utilizing the voltage-induced magnetization and polarization changes in the oxide multiferroic material, enabling faster switching with reduced energy consumption

Inventive Principle:
Principle #35Parameter changes

Applied Scientific Principles

This section explains which scientific principles are used to turn an abstract innovation direction into a practical engineering solution.

Function Achieved in This Case

This configuration enhances data stability and switching properties, allowing for reduced switching current and improved performance in magnetic memory devices, addressing the need for faster speeds and lower power consumption.

Implementation Method 1

The exchange coupling layer may have an electric polarization, which results from its ferroelectric property, with a direction that can be changed by a voltage applied to a corresponding one of the bit lines

Methodology Applied
Scientific EffectFerroelectric property:

Implementation Method 2

The exchange coupling layer may have magnetic moments, which result from its antiferromagnetic property, and whose directions can be changed by a voltage applied to the corresponding one of the bit lines

Methodology Applied
Scientific EffectAntiferromagnetic property:

Implementation Method 3

Resistance of the magnetic tunnel junction may vary depending on magnetization orientations of the magnetic layers. For example, the resistance of the magnetic tunnel junction may be higher when the magnetic layers have anti-parallel magnetization orientations than when they have parallel magnetization orientations

Methodology Applied
Scientific EffectMagnetoresistance: Magnetoresistance

Data Source

PatentUS9424904B2Magnetic memory devices including oxide multiferroic material
Publication Date: 2016.08.23 SAMSUNG ELECTRONICS CO LTD
  • US9424904B2 patent drawing
  • US9424904B2 patent drawing
  • US9424904B2 patent drawing

AI summary

A magnetic memory device is provided. The magnetic memory device includes a plurality of variable resistance devices connected to a word line, and a plurality of bit lines, each of which provides an electrical pathway between a corresponding one of the variable resistance devices and a read and write circuit. Each of the variable resistance devices includes a free layer and a pinned layer spaced apart from each other and having a tunnel barrier interposed therebetween, an assistant layer spaced apart from the tunnel barrier and having the free layer interposed therebetween, and an exchange coupling layer arranged between the free layer and the assistant layer. The exchange coupling layer has an electric polarization, which results from its ferroelectric property, and having a direction that can be changed by a voltage applied to the corresponding one of the bit lines.