Magnetic Memory Tester Shielded Field Acceleration
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Solution Overview
Problem
Current test methods for magnetic memory, such as retention, read disturb, and write error rate tests, are impractically long due to the dependence on external magnetic fields, requiring extensive time to verify the functionality of magnetic memory before commercialization.
Innovation Solution
A magnetic field acceleration test is implemented using a tester with a magnetic shield and a test magnetic field generating portion that applies a controlled external magnetic field to accelerate the testing process, reducing the time required for these tests by optimizing the orientation and strength of the test magnetic field.
Engineering Contradictions & Design Principles
Engineering Contradiction Analysis
1Reliability
If conventional test methods are used for magnetic memory, then test completeness is achieved, but test time becomes excessively long
Solution Approach 1:
The patent applies external magnetic fields as a test parameter to accelerate the testing process. By introducing magnetic field strength and orientation as controllable parameters, the test can induce faster magnetization transitions in the magnetoresistive elements, thereby reducing the time required to verify retention, read disturb, and write error rate characteristics while maintaining test completeness
Solution Approach 2:
The patent performs preliminary magnetization state setting before actual testing by applying controlled magnetic fields. This preliminary action prepares the magnetic memory in known states, enabling subsequent tests to proceed more efficiently without requiring lengthy natural stabilization periods, thus reducing overall test time while ensuring reliable test results
2Loss of time
If external magnetic fields are applied to accelerate testing, then test time is reduced, but test complexity increases
Solution Approach 1:
The patent introduces a magnetic field generating portion as an intermediary component between the test controller and the magnetic memory. This intermediary device simplifies the overall test system by providing a dedicated mechanism for magnetic field application, making the test equipment more manageable and easier to control compared to attempting to achieve the same acceleration through complex software or environmental controls
Solution Approach 2:
The patent divides the test system into distinct functional modules: a magnetic shield portion, a magnetic field generating portion, and a test controller. This segmentation allows each component to be optimized independently and simplifies the overall system architecture, making the increased complexity more manageable through modular design rather than a monolithic complex system
3Measurement precision
If magnetic shield portion is used to block external magnetic fields, then test accuracy is improved, but device complexity increases
Solution Approach 1:
The patent converts the potentially harmful effect of external magnetic field interference into a beneficial feature by using a magnetic shield portion. The shield not only blocks unwanted external fields to improve measurement precision but also works in conjunction with the magnetic field generating portion to create a controlled test environment. This approach transforms what would be a source of error into a tool for enhancing test accuracy
Solution Approach 2:
The patent merges the magnetic shield portion with the magnetic field generating portion into an integrated test chamber structure. This combination reduces overall device complexity by consolidating two functions (shielding and field generation) into a unified system rather than requiring separate, independent components, thereby achieving both test accuracy and equipment simplicity
Applied Scientific Principles
This section explains which scientific principles are used to turn an abstract innovation direction into a practical engineering solution.
Function Achieved in This Case
The accelerated test method significantly reduces the time needed for retention, read disturb, and write error rate tests, making it feasible to commercialize magnetic memory with higher yield rates and quality by detecting and replacing fail bits efficiently.
Implementation Method 1
a magnetic field generating portion in the space, the magnetic field generating portion generating a test magnetic field while the magnetic memory is tested by the test signal
Implementation Method 2
a magnetic shield portion having a space which is shielded from an external magnetic field
Data Source
AI summary
According to one embodiment, a tester includes a magnetic shield portion having a space which is shielded from an external magnetic field, a controller generating a test signal for testing a magnetic memory having a magnetoresistive element provided in the space, an interface portion in the space, the interface portion which functions as an interface between the controller and the magnetic memory, and a magnetic field generating portion in the space, the magnetic field generating portion generating a test magnetic field while the magnetic memory is tested by the test signal.