Magnetic Field Sensor Self-Test Circuit for Offset Compensation

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Solution Overview

Problem

Magnetic field sensors with back bias magnets often face non-uniform magnetic fields due to temperature variations, leading to different DC offsets for each sensor, which requires additional costly circuitry for compensation and can reduce the minimum usable air gap when using concentrators to mitigate this issue.

Innovation Solution

An apparatus with detection circuits, test circuits, and analog-to-digital converters to accurately determine speed and direction of a target, including a counter for error detection, a ramp generator for oscillator testing, and a comparator for ADC accuracy, allowing for self-testing and reducing the need for additional compensation circuitry.

Engineering Contradictions & Design Principles

VSEngineering Contradiction Analysis

1Reliability

If a back bias magnet is used to generate the magnetic field, then the magnetic field sensing elements can detect changes in bias magnetic field caused by movement of the target, but the magnetic field becomes non-uniform across the sensing area particularly over temperature, leading to different DC offsets for each sensor

Engineering Contradiction:
Improvedetection accuracyVSAvoidcircuit complexity
Core Design Contradiction:
ReliabilityVSDevice complexity

Solution Approach 1:

The patent implements self-test circuits that automatically detect and compensate for DC offsets without requiring external intervention. The test circuits generate test signals, measure the sensor responses, and calculate compensation values internally, allowing the sensor system to self-correct for non-uniform magnetic fields and temperature variations.

Inventive Principle:
Principle #25Self-service

Solution Approach 2:

The patent performs DC offset compensation measurements during initialization or calibration phases before actual sensing operations. By pre-characterizing the offset errors and storing compensation values, the system eliminates the need for complex real-time compensation circuitry during normal operation.

Inventive Principle:
Principle #10Preliminary action

2Stability of the object's composition

If concentrators are used in conjunction with back bias magnets to reduce the non-uniformity of the bias field, then the magnetic field uniformity improves, but the minimum usable air gap is reduced and the magnetic circuit cost increases

Engineering Contradiction:
Improvemagnetic field uniformityVSAvoidair gap
Core Design Contradiction:
Stability of the object's compositionVSLength of stationary object

Solution Approach 1:

The patent compensates for magnetic field non-uniformity by digitally adjusting sensor output parameters based on measured DC offsets. Instead of physically modifying the magnetic circuit with concentrators, the system changes the electrical parameters (offset compensation values) to correct for field variations, maintaining air gap and reducing magnetic circuit complexity.

Inventive Principle:
Principle #35Parameter changes

3Stability of the object's composition

If concentrators are used to reduce magnetic field non-uniformity, then the bias field uniformity improves, but the manufacturing cost of the magnetic circuit increases

Engineering Contradiction:
Improvemagnetic field uniformityVSAvoidmanufacturing cost
Core Design Contradiction:
Stability of the object's compositionVSEase of manufacture

Solution Approach 1:

The patent replaces mechanical/magnetic solutions (concentrators) with electronic/digital compensation methods. Instead of adding physical magnetic components to uniform the field, the system uses electronic test circuits and digital signal processing to measure and compensate for non-uniformity, significantly reducing manufacturing cost and complexity.

Inventive Principle:
Principle #28Mechanics substitution (Replace mechanical system)

4Measurement precision

If additional circuitry is added to compensate for different DC offsets, then the sensor accuracy improves, but the cost of the magnetic field sensor increases

Engineering Contradiction:
Improvesensor accuracyVSAvoidcircuit cost
Core Design Contradiction:
Measurement precisionVSDevice complexity

Solution Approach 1:

The patent combines the test/compensation circuitry with the main sensor signal processing path. The same analog-to-digital converters and processing logic are used for both normal sensing operations and offset measurements, eliminating the need for separate dedicated compensation hardware and reducing overall circuit cost.

Inventive Principle:
Principle #5Merging (Combining)

Applied Scientific Principles

This section explains which scientific principles are used to turn an abstract innovation direction into a practical engineering solution.

Function Achieved in This Case

The solution enables accurate detection of speed and direction with reduced complexity and cost by incorporating self-test capabilities within the magnetic field sensor system, effectively managing non-uniform magnetic fields and maintaining a larger air gap.

Implementation Method 1

Magnetic field sensors including a magnetic field sensing element, or transducer, such as a Hall Effect element or a magnetoresistive element

Methodology Applied
Scientific EffectHall Effect: Hall Effect

Implementation Method 2

Magnetic field sensors including a magnetic field sensing element, or transducer, such as a Hall Effect element or a magnetoresistive element

Methodology Applied
Scientific EffectMagnetoresistive effect: Magnetoresistance

Data Source

PatentUS11585868B2Systems and methods for magnetic field sensors with self-test
Publication Date: 2023.02.21 ALLEGRO MICROSYSTEMS LLC
  • US11585868B2 patent drawing
  • US11585868B2 patent drawing
  • US11585868B2 patent drawing

AI summary

Systems, methods, and apparatuses for magnetic field sensors with self-test include a detection circuit to detect speed and direction of a target. One or more circuits to test accuracy of the detected speed and direction may be included. One or more circuits to test accuracy of an oscillator may also be included. One or more circuits to test the accuracy of an analog-to-digital converter may also be included. Additionally, one or more IDDQ and/or built-in-self test (BIST) circuits may be included.