Monolithic Magnetic Sensor Signal Path Self-Test
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Solution Overview
Problem
Current methods for testing monolithically integrated magnet field sensors do not efficiently test the signal path without requiring additional testing connections or external circuits, and they are not cost-effective or flexible enough to accommodate varying conditions.
Innovation Solution
A method involving a first IC with a magnetic field sensor and a second IC with a control unit that switches the first IC from a normal operating state to a test mode, allowing for self-testing of the signal path by disconnecting and reconnecting the power supply and signal output, and using a test current source to simulate magnetic fields, thereby testing the ICs' behavior without external influences.
Engineering Contradictions & Design Principles
Engineering Contradiction Analysis
1Reliability
If additional testing connections or external circuits are used to test the signal path, then the completeness of the signal path test is improved, but the device complexity and manufacturing cost increase
Solution Approach 1:
The magnetic field sensor performs self-testing by generating its own test signal and evaluating it through the complete signal path. The sensor's evaluation unit processes the test signal internally, eliminating the need for external testing equipment or additional connections, thus achieving comprehensive testing without increasing device complexity
Solution Approach 2:
The magnetic field sensor is designed to perform both its primary sensing function and self-testing function using the same hardware components. The sensor can operate in normal mode for magnetic field detection and switch to test mode for self-diagnosis, making the device multi-functional without requiring separate testing circuits
2Measurement precision
If the testing procedure requires special assistive devices or external circuits, then the measurement precision is improved, but the ease of operation and productivity deteriorate
Solution Approach 1:
The sensor automatically performs self-testing without requiring external assistive devices. The control unit initiates the test mode, the evaluation unit processes the test signal, and the result is evaluated internally, making the testing procedure as simple as activating a test mode switch
Solution Approach 2:
The evaluation unit provides feedback by comparing the received test signal with an expected test signal and determining whether the signal path is functional. This automatic feedback mechanism eliminates the need for complex external measurement equipment while maintaining test accuracy
3Reliability
If the testing procedure requires changing interconnections between ICs, then the completeness of the test is improved, but the productivity and ease of operation worsen
Solution Approach 1:
The sensor performs self-testing through its internal evaluation unit without requiring any physical reconfiguration of connections. The same interconnections used for normal operation are utilized for testing, eliminating time-consuming connection changes and improving testing productivity
Solution Approach 2:
The sensor dynamically switches between normal operating mode and test mode through a control unit, allowing the same hardware to serve dual purposes. This dynamic switching eliminates the need for physical reconfiguration while maintaining comprehensive test coverage
Applied Scientific Principles
This section explains which scientific principles are used to turn an abstract innovation direction into a practical engineering solution.
Function Achieved in This Case
This method allows for comprehensive testing of the signal path between interconnected ICs without additional connections, enabling repeated testing with minimal equipment and flexibility to simulate magnetic field effects, thus providing a cost-effective and efficient testing solution.
Implementation Method 1
the first IC (S1) together with a magnetic field sensor (MFS)
Data Source
AI summary
A method for testing a signal path of a first IC formed as a monolithically integrated circuit on a semiconductor body together with a magnetic field sensor and has a signal output and a power supply connection and a test mode state and a normal operating state. A power supply of the first IC is switched off, and a signal output is connected with a reference potential, and the power supply of the first IC is switched on and the signal output is disconnected from the reference potential. Subsequently in a test mode state, a self-test is performed in the first IC and a test pattern is configured at the signal output or at the power supply connection and the test pattern is evaluated by the control unit for testing of the signal path.