Magnetoresistive Element Manufacturing Flatness

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Solution Overview

Problem

The manufacturing of thin-film magnetic heads with TMR or CPP-GMR structures faces challenges in achieving flatness of the upper shield layer, leading to unstable operations and reduced recording density due to asperities, which require costly planarization processes and thick cap layers.

Innovation Solution

The method involves forming an MR multi-layered structure with side surfaces perpendicular to the layer lamination plane, using a thinner first insulation layer and a thicker second insulation layer with a magnetic domain control bias layer, allowing for minimal or no planarization process and enhanced magnetic coupling.

Engineering Contradictions & Design Principles

VSEngineering Contradiction Analysis

1Manufacturing precision

If conventional planarization processes (CMP) are used to achieve flatness of the upper shield layer, then flatness is improved, but manufacturing complexity and cost increase

Engineering Contradiction:
Improveflatness of upper shield layerVSAvoidplanarization process complexity
Core Design Contradiction:
Manufacturing precisionVSDevice complexity

Solution Approach 1:

The patent applies preliminary action by forming the MR multi-layered structure with vertically perpendicular side surfaces before depositing the upper shield layer. This preliminary structural preparation ensures that the upper shield layer naturally forms with sufficient flatness during the deposition process itself, eliminating the need for subsequent CMP planarization processes.

Inventive Principle:
Principle #10Preliminary action

Solution Approach 2:

The patent extracts and removes the complex CMP planarization process from the manufacturing sequence. By designing the MR multi-layered structure with vertically perpendicular side surfaces, the patent eliminates the harmful asperities that would otherwise require CMP processing, thereby simplifying the overall manufacturing process.

Inventive Principle:
Principle #2Taking out (Extraction)

2Manufacturing precision

If CMP planarization process is performed to achieve flatness, then upper shield layer flatness is improved, but manufacturing cost increases

Engineering Contradiction:
Improveflatness of upper shield layerVSAvoidmanufacturing cost
Core Design Contradiction:
Manufacturing precisionVSEase of manufacture

Solution Approach 1:

The patent employs a disposable sacrificial layer (organic resin layer) that is easily removed after serving its purpose of defining the vertical side surfaces. This approach replaces expensive and time-consuming CMP processes with a simpler, more cost-effective methodology using temporary sacrificial materials that can be easily deposited and removed.

Inventive Principle:
Principle #27Cheap short-living objects (Disposable)

3Manufacturing precision

If thick cap layer is formed to enable planarization, then planarization can be performed, but MR element structure becomes more complex

Engineering Contradiction:
Improveplanarization capabilityVSAvoidMR element structure
Core Design Contradiction:
Manufacturing precisionVSDevice complexity

Solution Approach 1:

The patent extracts and eliminates the need for thick cap layers by directly forming the MR multi-layered structure with vertically perpendicular side surfaces through controlled deposition. This approach removes the unnecessary thick cap layer that would otherwise be required to provide sufficient material for CMP planarization, thereby simplifying the overall structure.

Inventive Principle:
Principle #2Taking out (Extraction)

4Ease of manufacture

If asperities are present in upper shield layer, then manufacturing is simpler, but MR element stability and resolution deteriorate

Engineering Contradiction:
Improvemanufacturing simplicityVSAvoidMR element stability
Core Design Contradiction:
Ease of manufactureVSReliability

Solution Approach 1:

The patent applies preliminary action by forming the MR multi-layered structure with vertically perpendicular side surfaces before depositing the upper shield layer. This preliminary structural preparation prevents the formation of asperities during shield layer deposition, ensuring stable MR element operation and high resolution without requiring complex post-processing.

Inventive Principle:
Principle #10Preliminary action

Solution Approach 2:

The patent applies preliminary anti-action by designing the vertical side surfaces to counteract and prevent the formation of asperities in the upper shield layer. The perpendicular geometry of the MR multi-layered structure acts as a preventive measure that eliminates the harmful effect of surface irregularities before they can develop during subsequent deposition processes.

Inventive Principle:
Principle #9Preliminary anti-action

Applied Scientific Principles

This section explains which scientific principles are used to turn an abstract innovation direction into a practical engineering solution.

Function Achieved in This Case

This approach results in a flat magnetic domain control bias layer without the need for extensive planarization, ensuring sufficient magnetic domain control and increased recording density without the necessity for costly planarization processes.

Implementation Method 1

giant magnetoresistive effect (GMR) thin-film magnetic heads with GMR read head elements are being improved. On the other hand, tunnel magnetoresistive effect (TMR) thin-film magnetic heads with TMR read head elements

Methodology Applied
Scientific EffectMagnetoresistive effect: Magnetoresistance

Implementation Method 2

a step of depositing an MR multi-layer, a step of patterning the deposited MR multi-layer by milling with a mask to form an MR multi-layered structure

Methodology Applied
Scientific EffectPhysical vapor deposition: Physical Vapour Deposition

Data Source

PatentUS7950135B2Manufacturing method of magnetoresistive effect element
Publication Date: 2011.05.31 TDK CORP
  • US7950135B2 patent drawing
  • US7950135B2 patent drawing
  • US7950135B2 patent drawing

AI summary

A manufacturing method of an MR element in which current flows in a direction perpendicular to layer planes, includes a step of forming on a lower electrode layer an MR multi-layered structure with side surfaces substantially perpendicular to the layer lamination plane, a step of forming a first insulation layer on at least the side surfaces of the formed MR multi-layered structure, a step of forming a second insulation layer and a magnetic domain control bias layer on the lower electrode layer, and a step of forming an upper electrode layer on the MR multi-layered structure and the magnetic domain control bias layer.