Real-Time Output Signal Adjustment in Device Maintenance Testing

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Solution Overview

Problem

Conventional device maintenance methods in plants and facilities are inefficient due to fixed test patterns, which cannot adapt to changing conditions, leading to prolonged test times and difficulties in checking output levels within set intervals, especially when multiple devices are involved or when different output levels are required.

Innovation Solution

A device maintenance apparatus that allows for real-time adjustments to the output signal's progress and value during testing, including forwarding, returning, maintaining, and changing instructions, enabling operators to modify the test pattern without waiting for predetermined intervals, thereby improving operational efficiency and flexibility.

Engineering Contradictions & Design Principles

VSEngineering Contradiction Analysis

1Adaptability or versatility

If a fixed test pattern is used for device maintenance, then the test procedure is simple and standardized, but the test time is prolonged and cannot adapt to changing conditions

Engineering Contradiction:
Improveadaptability to changing conditionsVSAvoidtest time
Core Design Contradiction:
Adaptability or versatilityVSLoss of time

Solution Approach 1:

The test pattern is transformed from a fixed, static sequence to a dynamic, adjustable sequence that can be modified in real-time during execution. Operators can change the progress and output values based on actual device conditions, allowing the system to adapt to varying maintenance needs without restarting the entire test pattern.

Inventive Principle:
Principle #15Dynamics

Solution Approach 2:

The invention allows changing key parameters of the test pattern (progress position and output signal values) during execution. This enables rapid adaptation to different device states or maintenance requirements by adjusting test parameters on-the-fly rather than following a rigid predetermined sequence.

Inventive Principle:
Principle #35Parameter changes

2Measurement precision

If a fixed test pattern with predetermined intervals is used, then the test structure is simple, but it is difficult to check output levels within set intervals when multiple devices are involved

Engineering Contradiction:
Improveoutput level checking accuracyVSAvoidtest pattern complexity
Core Design Contradiction:
Measurement precisionVSDevice complexity

Solution Approach 1:

The test pattern allows dynamic adjustment of progress and output values during execution. When multiple devices are tested, operators can modify the test progression to accommodate different device characteristics and check output levels at appropriate intervals for each device without following a rigid uniform schedule.

Inventive Principle:
Principle #15Dynamics

3Productivity

If the test pattern cannot be modified during execution, then the test procedure is straightforward, but operational efficiency is reduced due to inability to respond to changing conditions

Engineering Contradiction:
Improvemaintenance operation efficiencyVSAvoidoperation simplicity
Core Design Contradiction:
ProductivityVSEase of operation

Solution Approach 1:

The test system transitions from a static, unchangeable pattern to a dynamic pattern that accepts modifications during execution. Operators can input change instructions to adjust progress and output values in real-time, improving maintenance efficiency by responding to actual device conditions while maintaining relatively simple operation through an intuitive interface.

Inventive Principle:
Principle #15Dynamics

Solution Approach 2:

The system incorporates feedback mechanisms where test execution results and device conditions inform subsequent test adjustments. Operators receive information about device state and can modify the test pattern accordingly, creating a responsive maintenance process that adapts to actual conditions rather than forcing devices into a rigid test framework.

Inventive Principle:
Principle #23Feedback

Data Source

PatentEP3575910B1Device maintenance apparatus, device maintenance method, and non-transitory computer readable storage medium
Publication Date: 2021.02.17 YOKOGAWA ELECTRIC CORP
  • EP3575910B1 patent drawingFigure 1
  • EP3575910B1 patent drawingFigure 2
  • EP3575910B1 patent drawingFigure 3

AI summary

A device maintenance apparatus includes a test executor configured to cause a device to output an output signal based on a test pattern that changes the output signal output from the device with an elapse of time, and a change instructor configured to issue a change instruction for changing at least one of a progress of an output of the output signal based on the test pattern and an output value of the output signal to the test executor in accordance with an instruction input while the test executor causes the device to execute the output of the output signal.