Manufacturing Support System for Electronic Devices
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Solution Overview
Problem
The existing methods for determining improvement measures for manufacturing conditions in electronic device manufacturing are time-consuming, prone to calculation errors, and require advanced expertise, limiting their implementation and efficiency.
Innovation Solution
A manufacturing supporting system that includes an inspection-data acquiring unit, fluctuation-by-classification calculating unit, data-by-factor acquiring unit, and fluctuation-by-factor calculating unit, which analyzes inspection data and improvement history data to determine fluctuation factors and improvement measures for manufacturing conditions, enabling efficient decision-making without requiring extensive expertise.
Engineering Contradictions & Design Principles
Engineering Contradiction Analysis
1Reliability
If manual trial calculation is performed by a technician having expertise, then accurate improvement measures can be determined, but the process takes a long time and requires advanced expertise
Solution Approach 1:
The patent introduces a computer system as an intermediary between the inspection data and the improvement measure determination. The system includes a database storing inspection data and improvement measures, and a computer that automatically calculates cost effectiveness and determines improvement measures based on stored data, eliminating the need for manual technician intervention while maintaining accuracy
Solution Approach 2:
The system enables self-service by automatically performing the improvement measure determination process that previously required expert technicians. The computer system autonomously retrieves inspection data, calculates cost effectiveness, and determines improvement measures without human intervention, making the process both faster and accessible to non-experts
2Reliability
If manual trial calculation is performed by a technician, then improvement measures can be determined, but calculation mistakes often occur
Solution Approach 1:
The patent replaces the manual mechanical calculation process with an automated computer-based system. The computer automatically retrieves data from the database, performs cost effectiveness calculations, and determines improvement measures, eliminating human calculation errors while simplifying the operation for users
Solution Approach 2:
The system creates a digital copy of the improvement measure determination process that can be repeatedly executed without degradation in accuracy. The computer system replicates the calculation logic consistently, ensuring the same accurate results every time without the variability and errors associated with manual calculations
3Manufacturing precision
If improvement measures are determined manually by technicians, then processes in which technicians have expertise can be improved, but only limited processes can be addressed
Solution Approach 1:
The patent creates a universal system that can handle multiple types of manufacturing processes and inspection data through a single automated platform. The database stores diverse inspection data and improvement measures for various processes, and the computer system can automatically determine improvement measures for any process type covered in the database, greatly expanding versatility while maintaining precision
Data Source
AI summary
There is provided a manufacturing supporting system for an electronic device including an inspection-data acquiring unit, a fluctuation-by-classification calculating unit, a data-by-factor acquiring unit, and a fluctuation-by-factor calculating unit is provided. The inspection-data acquiring unit acquires an inspection data of a target electronic device. The fluctuation-by-classification calculating unit is configured to calculate, on the basis of the inspection data, by classification including at least any one of positions among lots, among substrates, and in a substrate plane of the electronic device, fluctuation in dimensions of the target electronic device. The data-by-factor acquiring unit acquires an improvement history data of the target electronic device. The fluctuation-by-factor calculating unit is configured to determine a plurality of fluctuation factors of the target electronic device on the basis of information concerning the plurality of fluctuation factors included in the improvement history data of the target electronic device, and calculate fluctuation in dimensions by the determined plurality of fluctuation factors. Thereby, there is provided a manufacturing supporting system, a manufacturing supporting method, and a manufacturing supporting program for an electronic device that support determination of an improvement measure for manufacturing conditions.


