Storage Device Testing by Mapped-Area Selection
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Solution Overview
Problem
Existing semiconductor memory devices face challenges in efficiently performing test operations, particularly in distinguishing between mapped and unmapped areas within their storage areas.
Innovation Solution
A method and system for a storage device and host device that includes a controller to manage test operations by determining test areas within mapped and unmapped regions, generating test requests, and transmitting test results, enabling efficient testing of semiconductor memory devices.
Engineering Contradictions & Design Principles
Engineering Contradiction Analysis
1Reliability
If a test operation is performed on the entire storage area, then the reliability of the storage device is improved, but the time required for testing increases
Solution Approach 1:
The storage area is divided into mapped areas (where data is actually stored) and unmapped areas (where data is not stored). The test operation is then segmented to test only the mapped areas, excluding unmapped areas from the testing scope. This segmentation allows the system to maintain reliability by testing actual data storage regions while reducing overall testing time by skipping regions that do not contain data.
2Productivity
If the storage area is divided into mapped and unmapped areas, then the testing efficiency is improved, but the complexity of determining test areas increases
Solution Approach 1:
The storage device autonomously determines and identifies mapped and unmapped areas within its storage space without requiring external intervention or complex manual configuration. The system uses its own internal data structures and control mechanisms to automatically distinguish between areas containing data and areas that do not, thereby simplifying the determination process while maintaining high testing efficiency.
3Reliability
If test requests are transmitted to the storage device, then the functionality assessment is improved, but the communication overhead increases
Solution Approach 1:
Instead of transmitting test requests for the entire storage area, the system transmits test requests only for the mapped areas where data actually exists. This partial action approach ensures that functionality assessment is performed on relevant data regions, improving assessment accuracy while reducing communication overhead and energy consumption by excluding unnecessary test requests for unmapped areas.
Data Source
AI summary
A method of operating a host device according to the present technology includes determining an area to be tested among a mapped area and an unmapped area included in a storage area of a storage device, generating a test request corresponding to the determined area, and transmitting the generated test request to the storage device.