Mark Position Detection Noise Filtering in Image Forming Devices
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Solution Overview
Problem
Conventional image-forming devices face challenges in accurately determining the positional relationships of marks due to signal interference from scratches and noise waves, leading to reduced accuracy in correcting registration errors.
Innovation Solution
An image-forming device comprising an image-forming unit, sensor, screening unit, excluding unit, and determining unit that forms marks on an object, detects reflected light waveforms, screens them into mark and noise waveforms, excludes adjacent noise-affected mark waveforms, and determines mark positions based on the remaining mark waveforms.
Engineering Contradictions & Design Principles
Engineering Contradiction Analysis
1Reliability
If the conventional image-forming device extracts only signal waves corresponding to marks by comparing wave height to a threshold, then noise waves from scratches are removed, but mark waveforms adjacent to noise waves are still included causing reduced detection accuracy
Solution Approach 1:
The patent extracts and removes mark waveforms that are adjacent to noise waves from the set of detected mark waveforms. The excluding unit specifically identifies and excludes mark waveforms whose wave height falls within a predetermined range of the noise wave height, thereby separating out the problematic adjacent marks that would otherwise contaminate the position detection accuracy.
Solution Approach 2:
The determining unit uses feedback from the noise wave detection to adjust the selection of mark waveforms. By comparing the wave height of each detected mark waveform against the detected noise wave height and applying exclusion criteria, the system refines the set of valid mark waveforms used for position determination, improving overall detection accuracy through iterative filtering.
2Measurement precision
If all detected signal waves above threshold are treated as marks, then detection sensitivity is maximized, but false detection of scratches as marks increases
Solution Approach 1:
The patent converts the harmful effect of noise waves from scratches into a beneficial filtering mechanism. By detecting noise waves and using their wave height characteristics as exclusion criteria, the system transforms the presence of scratches from a source of false positives into a tool for identifying and excluding adjacent mark waveforms that would otherwise be misidentified.
Solution Approach 2:
The system dynamically adjusts the selection criteria for mark waveforms based on the detected noise wave height. Instead of using a fixed threshold, the exclusion criterion adapts to the actual noise level by excluding mark waveforms whose wave height falls within a predetermined range of the noise wave height, thereby maintaining detection sensitivity while improving identification accuracy.
Applied Scientific Principles
This section explains which scientific principles are used to turn an abstract innovation direction into a practical engineering solution.
Function Achieved in This Case
This approach enhances the accuracy of determining mark positions by effectively filtering out noise waves, improving the precision of mark detection and registration correction, thereby maintaining high image quality.
Implementation Method 1
a sensor that detects light reflected from the object, the reflected light including a plurality of waveforms
Data Source
AI summary
An image-forming device includes an image-forming unit, a sensor, a screening unit, an excluding unit, and a determining unit. The image-forming unit forms a plurality of marks on an object. The sensor detects a light reflected on the object, the reflected light including a plurality of waveforms. The screening unit screens the plurality of waveforms into a plurality of mark waveforms corresponding to the plurality of marks respectively and a plurality of noise waveforms other than the plurality of mark waveforms. The excluding unit excludes a mark waveform adjacent to the noise waveform from the plurality of mark waveforms. The determining unit determines a position of each mark based on the plurality of mark waveforms from which the mark waveform adjacent to the noise waveform is excluded.