Marker Analysis Setting Automation for Image Processing

Resolve Bottlenecks,
Find Innovative Solutions
Generate Solutions

Solution Overview

Problem

Adjusting setting values for analyzing markers in images is complex due to variations in objects, environments, and marker sizes, requiring numerous and specific settings that are difficult for operators to determine accurately.

Innovation Solution

An information processing device with a first acquirer, a second acquirer, an analyzer, and a creating unit that acquires images and setting patterns, analyzes markers based on included setting values, and creates total information for each pattern to simplify the determination of appropriate setting values.

Engineering Contradictions & Design Principles

VSEngineering Contradiction Analysis

1Measurement precision

If multiple setting items are used for marker analysis, then analysis accuracy can be improved, but operator workload and complexity increase significantly

Engineering Contradiction:
Improvemarker analysis accuracyVSAvoidsetting adjustment complexity
Core Design Contradiction:
Measurement precisionVSDevice complexity

Solution Approach 1:

The system performs self-adjustment of setting values by automatically evaluating multiple candidate settings against photographed markers and selecting the optimal configuration. This eliminates the need for operators to manually adjust multiple setting items, resolving the contradiction between achieving high analysis accuracy and maintaining operational simplicity.

Inventive Principle:
Principle #25Self-service

Solution Approach 2:

The system automatically varies and evaluates multiple setting parameters (such as marker detection thresholds, size ranges, and recognition criteria) to determine the optimal configuration for different photographing conditions. This automated parameter optimization maintains high analysis accuracy while removing the complexity burden from operators.

Inventive Principle:
Principle #35Parameter changes

2Adaptability or versatility

If setting values are customized for different objects and environments, then analysis appropriateness is improved, but determination difficulty increases

Engineering Contradiction:
Improvesetting adaptabilityVSAvoidappropriate setting determination difficulty
Core Design Contradiction:
Adaptability or versatilityVSDifficulty of detecting and measuring

Solution Approach 1:

The system photographs actual markers in the target environment, evaluates the photographing results using candidate setting values, and automatically determines the appropriate settings based on this feedback loop. This approach enables the system to adapt to different objects and environments while automatically resolving the difficulty of determining appropriate settings, eliminating the need for operator expertise in setting selection.

Inventive Principle:
Principle #23Feedback

Data Source

PatentUS10755100B2Information processing device, system, information processing method, and storage medium
Publication Date: 2020.08.25 NS SOLUTIONS CORPORATION
  • US10755100B2 patent drawing
  • US10755100B2 patent drawing
  • US10755100B2 patent drawing

AI summary

An information processing device of the present invention includes a first acquirer, a second acquirer, an analyzer, and a creating unit. The first acquirer is configured to acquire a plurality of images in which a working environment is photographed. The second acquirer is configured to acquire a plurality of setting patterns including analysis setting values. The analysis setting values are setting values regarding an analysis of markers photographed in the images. The analyzer is configured to analyze the markers from the respective images acquired by the first acquirer based on the analysis setting values. The analysis setting values are included in the plurality of respective setting patterns acquired by the second acquirer. The creating unit is configured to create total information for each of the setting patterns. The total information is based on an analysis process of the markers corresponding to the setting patterns by the analyzer.