Mask Light Shielding Pattern for TFT Channel Uniformity

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Solution Overview

Problem

The fabrication of small-sized thin film transistors (TFTs) in display devices is prone to defects due to errors in the fabrication process, particularly in forming the channel region, which can lead to variations in width and signal transmission issues.

Innovation Solution

A mask with a light shielding pattern and auxiliary light shielding portions is used to prevent over-exposure during the light exposure process, ensuring precise definition of the channel boundaries by including semi-transmissive portions and protrusions at the ends of the source and drain electrodes, thereby maintaining uniformity and preventing concave portions in the channel.

Engineering Contradictions & Design Principles

VSEngineering Contradiction Analysis

1Manufacturing precision

If a conventional mask is used to form small-sized TFT channels, then the fabrication process is simple, but defects occur due to over-exposure and variations in channel width

Engineering Contradiction:
Improvechannel width uniformityVSAvoidmask structure complexity
Core Design Contradiction:
Manufacturing precisionVSDevice complexity

Solution Approach 1:

The mask's light shielding pattern is segmented into multiple functional regions: light transmitting portions for precise pattern definition, semi-transmissive portions for controlled light exposure to prevent over-exposure, and auxiliary light shielding portions to block stray light. This segmentation enables precise channel width control while managing the complexity through functional differentiation of mask regions.

Inventive Principle:
Principle #1Segmentation

Solution Approach 2:

Different regions of the mask are assigned different optical properties: the light transmitting portions have high transparency for precise pattern formation, the semi-transmissive portions provide reduced light transmission to prevent over-exposure, and the auxiliary light shielding portions block stray light. This local differentiation of optical qualities resolves the contradiction by tailoring each region's properties to its specific functional requirements.

Inventive Principle:
Principle #3Local quality

2Reliability

If the channel region is formed with precise boundaries, then signal transmission quality improves, but the light exposure process becomes more sensitive to errors

Engineering Contradiction:
Improvesignal transmission qualityVSAvoidlight exposure control precision
Core Design Contradiction:
ReliabilityVSMeasurement precision

Solution Approach 1:

The semi-transmissive portions act as an intermediary layer between the light source and the photoresist, providing controlled light transmission that prevents over-exposure while maintaining precise pattern boundaries. This intermediary mechanism protects the delicate light exposure process from errors, ensuring reliable channel formation without requiring extremely high exposure control precision.

Inventive Principle:
Principle #24Intermediary (Mediator)

Solution Approach 2:

The auxiliary light shielding portions are positioned in advance to block stray light before it can cause unwanted exposure or interference. This preemptive shielding cushions the light exposure process against potential errors, ensuring that only the intended light paths affect the photoresist, thereby maintaining measurement precision and signal transmission quality.

Inventive Principle:
Principle #11Beforehand cushioning (Prior cushioning)

3Manufacturing precision

If auxiliary light shielding portions are added to the mask, then over-exposure is prevented and channel uniformity is maintained, but the mask fabrication process becomes more complex

Engineering Contradiction:
Improvechannel boundary definition precisionVSAvoidmask fabrication ease
Core Design Contradiction:
Manufacturing precisionVSEase of manufacture

Solution Approach 1:

The auxiliary light shielding portions are merged with the main light shielding pattern as an integrated structure, formed in the same fabrication process steps. This merging approach combines the functional benefits of over-exposure prevention with the existing mask manufacturing workflow, reducing the practical impact on fabrication ease while maintaining high channel boundary definition precision.

Inventive Principle:
Principle #5Merging (Combining)

Applied Scientific Principles

This section explains which scientific principles are used to turn an abstract innovation direction into a practical engineering solution.

Function Achieved in This Case

This approach helps in preventing defects in the channel formation of small-sized TFTs, ensuring high-resolution display quality by maintaining uniform channel width and preventing signal transmission errors.

Implementation Method 1

a light shielding pattern including a light transmitting portion and a light shielding portion on the base substrate

Methodology Applied
Scientific EffectLight shielding: Absorption (EM radiation)

Implementation Method 2

including semi-transmissive portions and protrusions at the ends of the source and drain electrodes

Methodology Applied
Scientific EffectSelective light transmission: Absorption (EM radiation)

Data Source

PatentUS10191331B2Mask and method of fabricating display device using the mask
Publication Date: 2019.01.29 SAMSUNG DISPLAY CO LTD
  • US10191331B2 patent drawing
  • US10191331B2 patent drawing
  • US10191331B2 patent drawing

AI summary

A mask includes a base substrate, and a light shielding pattern including a light transmitting portion and a light shielding portion on the base substrate, wherein the light shielding portion includes a third source electrode portion, a third drain electrode portion spaced apart from the third source electrode portion and including at least a portion parallel to the third source electrode portion, a first auxiliary light shielding portion at an end portion of the third source electrode portion facing the third drain electrode portion, and a second auxiliary light shielding portion at an end portion of the third drain electrode portion facing the third source electrode portion.