Mass Flow Controller Verification for Semiconductor Gas Precision

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Solution Overview

Problem

Mass flow controllers used in semiconductor manufacturing experience a decrease in accuracy over time, affecting the precision of gas flow in thin-film deposition and etching processes, leading to potential errors in semiconductor device production.

Innovation Solution

A system is implemented to periodically verify and calibrate mass flow controllers by comparing detected flow rates with standard flow rates, using a control unit to calculate absolute volumes and detect flow rate errors, allowing for timely correction and maintenance.

Engineering Contradictions & Design Principles

VSEngineering Contradiction Analysis

1Productivity

If mass flow controller is used continuously for semiconductor manufacturing, then productivity is improved, but measurement precision deteriorates due to accuracy decrease over time

Engineering Contradiction:
Improvecontinuous manufacturing outputVSAvoidgas flow measurement accuracy
Core Design Contradiction:
ProductivityVSMeasurement precision

Solution Approach 1:

The patent implements periodic verification of the mass flow controller by introducing a verification gas flow system that periodically measures the actual gas flow rate and compares it with the controller's readings. This periodic action allows continuous manufacturing to proceed while regularly detecting accuracy degradation, thus resolving the contradiction between continuous productivity and measurement precision.

Inventive Principle:
Principle #19Periodic action

Solution Approach 2:

The system incorporates a feedback mechanism where the verification unit measures actual gas flow rates and feeds this information back to detect full-scale errors in the mass flow controller. This feedback loop enables continuous monitoring of measurement accuracy without interrupting the manufacturing process, allowing productivity to be maintained while precision is monitored and corrected.

Inventive Principle:
Principle #23Feedback

2Productivity

If mass flow controller operates for extended period, then productivity increases, but reliability decreases due to accuracy degradation

Engineering Contradiction:
Improvemanufacturing throughputVSAvoidprocess control reliability
Core Design Contradiction:
ProductivityVSReliability

Solution Approach 1:

The patent implements preliminary verification by establishing a baseline absolute volume of the verification chamber before production runs. This preliminary action creates a reference standard that enables ongoing reliability checks without interrupting manufacturing, allowing extended operation while maintaining process control reliability through pre-established verification criteria.

Inventive Principle:
Principle #10Preliminary action

Solution Approach 2:

The verification system provides continuous feedback on controller accuracy by comparing measured flow rates against calculated absolute volumes. This feedback mechanism maintains reliability by detecting drift in the mass flow controller's performance over time, enabling corrective actions before reliability degradation affects product quality.

Inventive Principle:
Principle #23Feedback

3Measurement precision

If verification system is added to mass flow controller, then measurement precision is maintained, but device complexity increases

Engineering Contradiction:
Improvegas flow measurement accuracyVSAvoidcontroller system complexity
Core Design Contradiction:
Measurement precisionVSDevice complexity

Solution Approach 1:

The verification unit is designed to serve multiple functions: it verifies mass flow controller accuracy, calculates absolute chamber volumes, detects full-scale errors, and provides calibration data. This multi-functionality maintains measurement precision while minimizing the addition of separate dedicated systems, thus reducing the impact on device complexity.

Inventive Principle:
Principle #6Universality (Multi-functionality)

Solution Approach 2:

The system enables self-verification by using the verification gas flow system to automatically measure and compare actual flow rates against controller readings. This self-service capability maintains measurement precision without requiring external verification equipment or manual calibration procedures, thereby limiting the increase in device complexity.

Inventive Principle:
Principle #25Self-service

4Reliability

If periodic verification is implemented, then reliability is maintained, but loss of time increases due to verification intervals

Engineering Contradiction:
Improvemeasurement reliabilityVSAvoidverification and calibration time
Core Design Contradiction:
ReliabilityVSLoss of time

Solution Approach 1:

The verification system is designed to operate during idle periods or between production batches, maintaining measurement reliability without interrupting the continuous manufacturing process. By utilizing otherwise idle time for verification activities, the system maintains reliability while minimizing loss of productive time.

Inventive Principle:
Principle #20Continuity of useful action

Solution Approach 2:

The system performs verification at intervals that balance reliability maintenance with productivity preservation. Rather than continuous verification that would halt production, partial verification at strategically chosen intervals maintains sufficient reliability while minimizing time loss, representing an optimized compromise between the two competing requirements.

Inventive Principle:
Principle #16Partial or excessive action

Data Source

PatentUS10845232B2Mass flow controller, apparatus for manufacturing semiconductor device, and method for maintenance thereof
Publication Date: 2020.11.24 SAMSUNG ELECTRONICS CO LTD
  • US10845232B2 patent drawing
  • US10845232B2 patent drawing
  • US10845232B2 patent drawing

AI summary

Disclosed are mass flow controllers, apparatuses for manufacturing semiconductor devices, and methods of maintenance thereof. The mass flow controller may control an amount of a gas provided into a chamber. The mass flow controller may be configured to obtain an absolute volume of the gas provided into the chamber at a standard flow rate when the mass flow controller is initially used. The mass flow controller may be configured to obtain a detected flow rate of the gas provided at a measured flow rate after the mass flow controller has been used for a predetermined time. The mass flow controller may be configured to compare the detected flow rate and the standard flow rate to verify a full-scale error in the measured flow rate.