Mass Spectrometer Electron Beam Injection Synchronization
Find Innovative SolutionsGenerate Solutions
Solution Overview
Problem
Mass spectrometers face a challenge in maximizing the number of electrons injected into an ion trap due to ejection phenomena caused by periodic positive and negative voltages applied to the RF electrode, which degrades the precision of mass analysis.
Innovation Solution
A mass spectrometer system that includes a reference waveform generator, a waveform generator, an RF module, an electron beam generator, and a control circuit to synchronize the operation of a UV diode with the RF voltage signal applied to the ion trap, using square and sine wave signals to control the electron beam injection, thereby maximizing the number of electrons injected and minimizing ejection.
Engineering Contradictions & Design Principles
Engineering Contradiction Analysis
1Productivity
If periodic positive and negative voltages are applied to the RF electrode for ion trapping operation, then ion trapping and ejection functions are enabled, but electrons are ejected from the ion trap reducing injection efficiency
Solution Approach 1:
The patent applies periodic action by synchronizing the electron beam injection with the periodic RF voltage cycles. The electron beam is injected during specific phases (when RF voltage is positive or negative) to coincide with the trapping conditions, thereby maximizing electron retention while maintaining the necessary periodic voltage application for ion trap operation
Solution Approach 2:
The patent implements preliminary action by pre-synchronizing the electron beam injection timing with the RF voltage phase before injection occurs. The control system anticipates the RF voltage cycles and schedules electron beam injection during optimal phases, ensuring electrons are introduced when trapping conditions are favorable rather than reacting after ejection occurs
2Measurement precision
If a large amount of electrons is injected into the ion trap to improve mass analysis precision, then measurement precision improves, but electron ejection due to RF voltage increases
Solution Approach 1:
The patent utilizes periodic action by injecting electrons in synchronized pulses that match the RF voltage cycles. Instead of continuous injection that would expose electrons to all phases including ejection-prone phases, the periodic pulsed injection aligns with trapping phases, maintaining high electron population for precision while minimizing losses through phase-selective timing
Solution Approach 2:
The patent achieves continuity of useful action by maintaining a steady stream of injected electrons through synchronized periodic pulses. The electron beam injection is continuous in the sense that it occurs every RF cycle during trapping phases, ensuring constant electron population for mass analysis precision while the periodic nature prevents accumulation during ejection phases
Applied Scientific Principles
This section explains which scientific principles are used to turn an abstract innovation direction into a practical engineering solution.
Function Achieved in This Case
This approach enhances the precision of mass analysis by maximizing the number of electrons injected into the ion trap, reducing electron loss and improving the accuracy of mass analysis.
Implementation Method 1
an electron beam generator (350) which controls an operation of an ultraviolet (UV) diode (351) for generating an electron beam injected into the ion trap (132)
Data Source
AI summary
The present invention relates to an electron bean injection control of a mass spectrometer. A mass spectrometer of the present invention includes: a reference waveform generator configured to generate a reference waveform signal having one type of a square wave and a sine wave, a waveform generator configured to generate a sync signal synchronized with the reference waveform signal; an RF module configured to generate an RF voltage signal from the reference waveform signal and apply the RF voltage signal to an RF electrode in the ion trap, an electron beam generator configured to control an operation of an ultraviolet (UV) diode for generating an electron beam injected into the ion trap according to an input control signal, and a control circuit configured to generate the control signal by using the square wave signal.


